International Rectifier PD-9.1090 IRL640S HEXFET Power MOSFET @ Surface Mount Dynamic dv/dt Repetitive Aval Fast Switching Description Third Generation HEXFETs from International Rectifier provide the designer with the best combination of fast switching, ruggedized device design, low Available in Tape & Reel Logic-Level Gate Drive Rpsv(on) Specified at Vas=4V & 5V Rating janche Rated Voss = 200V Rosion) = 0.18Q Ipn=17A on-resistance and cost-effectiveness. The SMD-220 is a surface mount power package capable of accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-resistance in any existing surface mount package. The SMD-220 is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W ina typical surface mount application. Absolute Maximum Ratings SMD-220 Parameter Max. Units Ip @ To = 25C Continuous Drain Current, Vas @ 5.0 V 17 Ip @ Tc = 100C | Continuous Drain Current, Ves @ 5.0 V 1 A lpm Pulsed Drain Current 68 Po @ Tc= 25C _| Power Dissipation 125 Ww Pp @ Ta= 25C | Pawer Dissipation (PCB Mount)** 3.1 Linear Derating Factor 1.0 WEC Linear Derating Factor (PCB Mount)** 0.025 Vas Gate-to-Source Voltage +10 Vv Eas Single Pulse Avalanche Energy @ 580 mJ lar Avalanche Current 10 A Ear Repetitive Avalanche Energy 13 mJ av/dt Peak Diode Recovery dv/dt @ _ tk BO Vins _| Tu, Tsta Junction and Storage Temperature Range -55 to +150 C _Soldering Temperature, for 10 seconds 300 (1.6mm from case) - Thermal Resistance : Parameter | Min. Typ. Max. Units | Rac Junction-to-Case _ _ 1.0 Resa Junction-to-Ambient (PCB mount)** = 40 CMW | Rea Junction-to-Ambient 62 ** When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994.IRL640S Electrical Characteristics @ Ts = 25C (unless otherwise specified) L Parameter : | Min. | Typ. | Max. | Units | Test Conditions Vierypss - Drain-to-Source Breakdown Voltage 200 | | V_|Vas=0V, In= 250nA AV erypss/ATu! Breakdown Voltage Temp. Coefficient | [0.27 | wre \ Reference to 25C, Ip= 1mA rs OO t | Rosion) | Static Drain-to-Source On-Resistance [ _ | oy | a aw = "Veseny | Gate Threshold Voltage [40 | 20 v_ | Vos=Vas, lo= 25014 | Os ___ | Forward Transconductance | 16 i | 5 : | Vos=50V, Ip=10A | loss : Drain-to-Source Leakage Current | - =| 2s t 25 | HA Vos=200V,VaseOV : _ | 250 / Vps=160V, Vas=0V, Ty=125C [ecw | Gate-to-Source Forward Leakage | = | 100 | a Ves=10V . | Gate-to-Source Reverse Leakage I _ | -100 Vogs=-10V Qy Total Gate Charge , _ 66 Ips 17A Gas Gate-to-Source Charge | 90 | nC | Vog=160V | Qog | Gate-to-Drain ("Miller") Charge | = | 38 Vas=5.0V See Fig. 6 and 13 tajon) Tum-On Delay Time _ 8.90 _ Vop=100V ty ____ Rise Time 83 | | A, [I 17A tarot ____Tum-Off Delay Time _ 44 | Re=4.6Q Ith __| Fall Time _ 52 = Ro=5.7Q See Figure 10 @ Lo Internal Drain Inductance _ 45 Bo toeen) i Po | - _ . nH | from package al Ls Internal Source Inductance - ' 75 = and center of die contact 8 | Cis Input Capacitance _"T) 4800. Vas=0V Coss Output Capacitance [ =] 400. | pF | Vos= 25V | Cres | Reverse Transfer Capacitance ; | 120] } f=1.0MHz See Figure 5 Source-Drain Ratings and Characteristics Parameter * Min. | Typ. |! Max. | Units | Test Conditions Is Continuous Source Current _. _ 47 MOSFET symbot o (Body Diode) : A showing the Ism Pulsed Source Current | _ _ 68 integral reverse (Body Diode) @ ' | p-n junction diode. 8 Vsp Diode Forward Voltage _ [20 Vo | Ty=25C, I5=17A, Vas=0V @ be : Reverse Recovery Time 310 | 470 ns | Ty=25C, Ir=17A Qn | Reverse Recovery Charge , | 32, 48 | pC 'difdt=-100A/us fon ' Forward Turn-On Time : ; Intrinsis turn-on fime is neglegible (turn-on is dominated by LstLo) Notes: @ Repetitive rating; pulse width limited by & Isps17A, di/dt<150A/us, Vop