Rev. 1.0 6/12 Copyright © 2012 by Silico n Laboratories Si515
VOLTAGE-CONTROLLED CRYSTAL OSCILLATOR (VCXO)
100 kHZ TO 250 MHZ
Features
Applications
Description
The Si515 VCXO utilizes Silicon Laboratories' advanced PLL technology to
provide any frequency from 100 kHz to 250 MHz. Unlike a traditional VCXO where
a different crystal is required for each output frequency, the Si515 uses one fixed
crystal and Silicon Labs’ proprietary synthesizer to generate any frequency across
this range. This IC-based approach allows the crystal resonator to provide
enhanced reliability, improved mechanical robustness, and excellent stability. In
addition, this solution provides superior control voltage linearity and supply noise
rejection, improving PLL stability and simplifying low jitter PLL design in noisy
environments. The Si515 is factory-configurable for a wide variety of user
specifications, including frequency, supply voltage, output format, tuning slope and
stability. Specific configurations are factory-programmed at time of shipment,
eliminating long lead times and non-recurring engineering charges associated with
custom frequency oscillators.
Functional Block Diagram
Supports any frequency from
100 kHz to 250 MHz
Low-jitter operation
Short lead times: <2 weeks
AT-cut fundamental mode crystal
ensures high reliability/low aging
High power supply noise rejection
1% control voltage linearity
Available CMOS, LVPECL, LVDS,
and HCSL outputs
Optional integrated 1:2 CMOS
fanout buffer
3.3 and 2.5 V supply options
Industry-standard 3.2 x 5.0 mm
and 5 x 7 mm package/pinouts
Pb-free/RoHS-compliant
Selectable Kv (60, 90, 120,
150 ppm/V)
SONET/SDH/OTN
PON
Low Jitter PLLs
xDSL
Broadcast video
Telec o m
Switches/routers
FPGA/ASIC clock generation
VDD
Any-Frequency
0.1 to 250 MHz
Clock Synthesis
Fixed
Frequency
Oscillator
CLK+
CLK–
GND
Vc ADC
Power Supply Filtering
OE
Ordering Information:
See page 14.
Pin Assignments:
See page 12.
Si5602
1
2
3
6
5
4
VDD
CLK–
CLK+
GND
OE
Vc
LVPECL/LVDS/HCSL/
Dual CMOS VCXO
1
2
3
6
5
4
VDD
NC
CLK
GND
OE
Vc
CMOS VC XO
Si515
Si515
2 Rev. 1.0
Si515
Rev. 1.0 3
TABLE OF CONTENTS
Section Page
1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4
2. Pin Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
2.1. Dual CMOS Buffer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
3. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14
4. Package Outline Diagram: 5 x 7 mm, 6-pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
5. PCB Land Pattern: 5 x 7 mm, 6-pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
6. Package Outline Diagram: 3.2 x 5.0 mm, 6-pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17
7. PCB Land Pattern: 3.2 x 5.0 mm, 6-pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18
8. Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
8.1. Si515 Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
8.2. Top Marking Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
Si515
4 Rev. 1.0
1. Electrical Specifications
Table 1. Recommended Operating Conditions
VDD = 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter Symbol Test Condition Min Typ Max Unit
Supply Voltage
VDD
3.3 V option 2.97 3.3 3.63 V
2.5 V option 2.25 2.5 2.75 V
Supply Current
IDD
CMOS, 100 MHz,
single-ended
—2429mA
LVDS
(output enabled)
—2226mA
LVPECL
(output enabled)
—4246mA
HCSL
(output enabled)
—4447mA
Tristate
(output disabled)
——22mA
OE “1” Setting VIH See Note 0.80 x VDD ——V
OE “0” Setting VIL See Note 0.20 x VDD V
OE Internal Pull-Up/
Pull-Down Resistor*
RI—45k
Operating Temperature TA–40 85 oC
*Note: Active high and active low polarity OE options available. Active high uses internal pull-up. Active low uses internal pull-
down. See ordering information on page 13.
Si515
Rev. 1.0 5
Table 2. Vc Control Voltage Input
VDD = 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter Symbol Test Condition Min Typ Max Unit
Control Voltage Range VC0.1 x VDD VDD/2 0.9 x VDD V
Control Voltage Tuning Slope
(10 to 90% VDD)
Kv Positive slope,
ordering option
60, 90, 120, 150 ppm/V
Kv Variation Kv_var ±10 %
Control Voltage Linearity LVC BSL –5 ±1 +5 %
Modulation Bandwidth BW 10 kHz
Vc Input Impedance ZVC —100k
Table 3. Output Clock Frequency Characteristics
VDD = 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter Symbol Test Condition Min Typ Max Unit
Nominal Frequency FOCMOS, Dual CMOS 0.1 212.5 MHz
FOLVDS/LVPECL/HCSL 0.1 250 MHz
Temperature Stability STTA = –40 to +85 oC –20 +20 ppm
Aging A Frequency drift over 10 year life ±8.5 ppm
Minimum Absolute Pull Range APR Ordering option ±30, ±50,±80, ±100 ppm
Startup Time TSU Minimum VDD to output fre-
quency (FO) within specification
——10ms
Disable Time TDFO
10 MHz 5 µs
FO<10MHz 40 µs
Enable Time TEFO
10 MHz 20 µs
FO<10MHz 60 µs
Si515
6 Rev. 1.0
Table 4. Output Clock Levels and Symmetry
VDD = 2.5 or 3.3 V ±10%, TA = –40 to +85 oC
Parameter Symbol Test Condition Min Typ Max Unit
CMOS Output Logic High VOH 0.85 x VDD ——V
CMOS Output Logic Low VOL 0.15 x VDD V
CMOS Output Logic High
Drive IOH
3.3 V –8 mA
2.5 V –6 mA
CMOS Output Logic Low
Drive IOL
3.3 V 8 mA
2.5 V 6 mA
CMOS Output Rise/Fall Time
(20 to 80% VDD)
TR/TF
0.1 to 125 MHz,
CL = 15 pF —0.81.2ns
0.1 to 212.5 MHz,
CL = no load —0.60.9ns
LVPECL/HCSL Output
Rise/Fall Time
(20 to 80% VDD)
TR/TF——565ps
LVDS Output Rise/Fall Time
(20 to 80% VDD)TR/TF——800ps
LVPECL Output Common
Mode VOC
50 to VDD – 2 V,
single-ended VDD
1.4 V —V
LVPECL Output Swing VO
50 to VDD – 2 V,
single-ended 0.55 0.8 0.90 VPPSE
LVDS Output Common Mode VOC
100 line-line,
VDD = 3.3/2.5 V 1.13 1.23 1.33 V
LVDS Output Swing VO
Single-ended 100 
differential termination 0.25 0.38 0.42 VPPSE
HCSL Output Common Mode VOC 50 to ground 0.35 0.38 0.42 V
HCSL Output Swing VOSingle-ended 0.58 0.73 0.85 VPPSE
Duty Cycle DC 48 50 52 %
Si515
Rev. 1.0 7
Table 5. Output Clock Jitter and Phase Noise (LVPECL)
VDD = 2.5 or 3.3 V ±10%, TA= –40 to +85 oC; Output Format = LVPECL
Parameter Symbol Test Condition Min Typ Max Unit
Period Jitter (RMS) JPRMS 10 k samples1——1.3 ps
Period Jitter (PK-PK) JPPKPK 10 k samples1——11 ps
Phase Jitter (RMS)
φJ
12 kHz to 20 MHz2 (brickwall) 0.9 1.3 ps
1.875 MHz to 20 MHz2 (brickwall) 0.25 0.5 ps
Phase Noise, 155.52 MHz
φN
100 Hz offset –71 dBc/Hz
1 kHz offset –93 dBc/Hz
10 kHz offset –113 dBc/Hz
100 kHz offset –124 dBc/Hz
1 MHz offset –136 dBc/Hz
Additive RMS Jitter Due to
External Power Supply
Noise3JPSRR
100 kHz sinusoidal noise 4.0 ps
200 kHz sinusoidal noise 3.5 ps
500 kHz sinusoidal noise 3.5 ps
1 MHz sinusoidal noise 3.5 ps
Spurious Performance SPR FO=156.25MHz,
Offset > 10 kHz —–75 dBc
Notes:
1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,
212.5, 250 MHz.
2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5, 250 MHz.
3. 156.25 MHz. Increase in jitter on output clock due to spurs introduced by sinewave noise added to VDD (100 mVPP).
Si515
8 Rev. 1.0
Table 6. Output Clock Jitter and Phase Noise (LVDS)
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA= –40 to +85 oC; Output Format = LVDS
Parameter Symbol Test Condition Min Typ Max Unit
Period Jitter
(RMS)
JPRMS 10k samples1 ——2.1ps
Period Jitter
(Pk-Pk)
JPPKPK 10k samples1 ——18ps
Phase Jitter
(RMS)
φJ 1.875 MHz to 20 MHz integration
bandwidth2 (brickwall)
—0.250.55ps
12 kHz to 20 MHz integration band-
width2 (brickwall)
—0.81.1ps
Phase Noise,
156.25 MHz
φN100Hz72dBc/Hz
1kHz 93 dBc/Hz
10 kHz –114 dBc/Hz
100 kHz –123 dBc/Hz
1 MHz –136 dBc/Hz
Spurious SPR LVPECL output, 156.25 MHz,
offset>10 kHz
—–75—dBc
Notes:
1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,
212.5, 250 MHz.
2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 and 250 MHz.
Si515
Rev. 1.0 9
Table 7. Output Clock Jitter and Phase Noise (HCSL)
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC; Output Format = HCSL
Parameter Symbol Test Condition Min Typ Max Unit
Period Jitter
(RMS)
JPRMS 10k samples*——1.2ps
Period Jitter
(Pk-Pk)
JPPKPK 10k samples*——11ps
Phase Jitter
(RMS)
φJ 1.875 MHz to 20 MHz integration
bandwidth*(brickwall)
—0.250.30ps
12 kHz to 20 MHz integration band-
width* (brickwall)
—0.81.0ps
Phase Noise,
156.25 MHz
φN100Hz75dBc/Hz
1kHz 98 dBc/Hz
10 kHz –117 dBc/Hz
100 kHz –127 dBc/Hz
1 MHz –136 dBc/Hz
Spurious SPR LVPECL output, 156.25 MHz,
offset>10 kHz
—–75—dBc
*Note: Applies to an output frequency of 100 MHz.
Si515
10 Rev. 1.0
Table 8. Output Clock Jitter and Phase Noise (CMOS, Dual CMOS)
VDD = 1.8 V ±5%, 2.5 or 3.3 V ±10%, TA = –40 to +85 oC; Output Format = CMOS, Dual CMOS
Parameter Symbol Test Condition Min Typ Max Unit
Phase Jitter
(RMS)
φJ 1.875 MHz to 20 MHz integration
bandwidth2 (brickwall)
—0.250.35ps
12 kHz to 20 MHz integration band-
width2 (brickwall)
—0.81.1ps
Phase Noise,
156.25 MHz
φN100Hz71dBc/Hz
1kHz 93 dBc/Hz
10 kHz –113 dBc/Hz
100 kHz –123 dBc/Hz
1 MHz –136 dBc/Hz
Spurious SPR LVPECL output, 156.25 MHz,
offset>10 kHz
—–75—dBc
Notes:
1. Applies to output frequencies: 74.17582, 74.25, 75, 77.76, 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25,
212.5 MHz.
2. Applies to output frequencies: 100, 106.25, 125, 148.35165, 148.5, 150, 155.52, 156.25, 212.5 MHz.
Table 9. Environmental Compliance and Package Information
Parameter Conditions/Test Method
Mechanical Shock MIL-STD-883, Method 2002
Mechanical Vibration MIL-STD-883, Method 2007
Solderability MIL-STD-883, Method 2003
Gross and Fine Leak MIL-STD-883, Method 1014
Resistance to Solder Heat MIL-STD-883, Method 2036
Moisture Sensitivity Level MSL 1
Contact Pads Gold over Nickel
Si515
Rev. 1.0 11
Table 10. Thermal Characteristics
Parameter Symbol Test Condition Value Unit
Thermal Resistance Junction to Ambient JA Still air 110 °C/W
Table 11. Absolute Maximum Ratings1
Parameter Symbol Rating Unit
Maximum Operating Temperature TAMAX 85 oC
Storage Temperature TS–55 to +125 oC
Supply Voltage VDD –0.5 to +3.8 V
Input Voltage (any input pin) VI–0.5 to VDD + 0.3 V
ESD Sensitivity (HBM, per JESD22-A114) HBM 2 kV
Soldering Temperature (Pb-free profile)2TPEAK 260 oC
Soldering Temperature Time at TPEAK (Pb-free profile)2TP 20–40 sec
Notes:
1. Stresses beyond those listed in this table may cause permanent damage to the device. Functional operation or
specification compliance is not implied at these conditions. Exposure to maximum rating conditions for extended
periods may affect device reliability.
2. The device is compliant with JEDEC J-STD-020.
Si515
12 Rev. 1.0
2. Pin Descriptions
Table 12. Si515 Pin Descriptions (CMOS)
Pin Name CMOS Function
1 VCControl Voltage Input.
2OE Output Enable. Internal pull-up for OE active high. Pull-
down for OE active low. See ordering information.
3GND Electrical and Case Ground.
4CLK Clock Output.
5NC No connect. Make no external connection to this pin.
6 VDD Power Supply Voltage.
Table 13. Si515 Pin Descriptions (LVPECL/LVDS/HCSL/Dual CMOS)
Pin Name LVPECL/LVDS/HCSL/Dual CMOS Function
1 VCControl Voltage Input.
2OE Output Enable. Internal pull-up for OE active high. Pull-
down for OE active low. See ordering information.
3GND Electrical and Case Ground.
4CLK+ Clock Output.
5CLK– Complementary Clock Output.
6 VDD Power Supply Voltage.
1
2
3
6
5
4
VDD
CLK–
CLK+
GND
OE
Vc
LVPECL/LVDS/HCSL/
Dual CMOS VCX
O
1
2
3
6
5
4
VDD
NC
CLK
GND
OE
Vc
CMO S VCXO
Si515
Rev. 1.0 13
2.1. Dual CMOS Buffer
Dual CMOS output format ordering options support either complementary or in-phase output signals. This feature
enables replacement of multiple VCXOs with a single Si515 device.
Figure 1. Integrated 1:2 CMOS Buffer Supports Complementary or In-Phase Outputs
~
~
Complementary
Outputs
In-Phase
Outputs
Si515
14 Rev. 1.0
3. Ordering Information
The Si515 supports a variety of options including frequency, stability, tuning slope, output format, and VDD. Specific
device configurations are programmed into the Si515 at time of shipment. Configurations are specified using the
Part Number Configuration chart shown below. Silicon Labs provides a web browser-based part number
configuration utility to simplify this process. Refer to www.silabs.com/VCXOPartNumber to access this tool. The
Si515 VCXO series is supplied in industry-standard, RoHS compliant, lead-free, 3.2 x 5.0 mm and 5 x 7 mm
packages. Tape and reel packaging is an ordering option.
Figure 2. Part Number Convention
Example ordering part number: 515BBB212M500BAGR.
The series prefix, 515, indicates the device is a single frequency VCXO.
The 1st option code B specifies the output format is LVDS and powered from a 3.3 V supply. The stability and APR
code B indicates a temperature stability of ±20 ppm with a tuning slope of ±120 ppm/V. The 3rd option code B
specifies the OE pin is active low.
The frequency code is 212M500. Per this convention, and as indicated by the part number lookup utility at
www.silabs.com/VCXOpartnumber, the output frequency is 212.5 MHz. The package code B refers to the
3.2 x 5 mm footprint with six pins. The last A refers to the product revision, G indicates the temperature range (–40
to +85 °C), and R specifies the device ships in tape and reel format.
Note: CMOS and Dual CMOS maximum frequency is 212.5 MHz.
Series Output Format Package
515
Single Frequency VCXO
LVPECL, LVDS, HCSL,
CMOS, Dual CMOS 6-pin
A = Revision: A
G = Temp Range: -40°C to 85°C
R = Tape & Reel; Blank = Trays.
515
XXXMXXX
1
st
Option Code:
Output Format
VDD Output Format
A 3.3V LVPECL
AGR
515
XXXMXXX
B3.3V LVDS
C3.3V CMOS
D 3.3V HCSL
E 2.5V LVPECL
AGR
Package Option
Dimensions
A
5x7mm
F2.5V LVDS
G2.5V CMOS
H 2.5V HCSL
M 3.3V Dual CMOS (In-phase)
3
rd
Option Code:
Output Enable
OE Polarity
A
OE Active High
2
nd
Option Code: Stability & APR
A
5
x
7
mm
B 3.2 x 5 mm
N 3.3V Dual CMOS (Complementary)
P 2.5V Dual CMOS (In-phase)
Q 2.5V Dual CMOS (Complementary)
Frequency Code
A
OE
Active
High
B OE Active Low
2
Option
Code:
Stability
&
APR
Frequency
Code
Frequency Description
Mxxxxxx fOUT < 1 MHz
xMxxxxx 1 MHz fOUT < 10 MHz
M
10 MH
f
100 MH
Temp
Stability Kv Minimum APR
3.3 V 2.5 V
A ±20ppm ±150ppm/V ±100ppm ±80ppm
xx
M
xxxx
10
MH
z
f
OUT <
100
MH
z
xxxMxxx 100 MHz fOUT < 250 MHz
xxxxxx Code if frequency requires >6 digit resolution
B ±20ppm ±120ppm/V ±80ppm ±50ppm
C ±20ppm ±90ppm/V ±50ppm ±30ppm
D ±20ppm ±60ppm/V ±30ppm Not Supported
Si515
Rev. 1.0 15
4. Package Outline Diagram: 5 x 7 mm, 6-pin
Figure 3 illustrates the package details for the Si515. Table 14 lists the values for the dimensions shown in the
illustration.
Figure 3. Si515 Outline Diagram
Table 14. Package Diagram Dimensions (mm)
Dimension Min Nom Max
A 1.50 1.65 1.80
b 1.30 1.40 1.50
c 0.50 0.60 0.70
D 5.00 BSC.
D1 4.30 4.40 4.50
e 2.54 BSC.
E 7.00 BSC.
E1 6.10 6.20 6.30
H 0.55 0.65 0.75
L 1.17 1.27 1.37
L1 0.05 0.10 0.15
p 1.80 2.60
R 0.7 REF.
aaa 0.15
bbb 0.15
ccc 0.10
ddd 0.10
eee 0.05
Notes:
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and Tolerancing per ANSI Y14.5M-1994.
Si515
16 Rev. 1.0
5. PCB Land Pattern: 5 x 7 mm, 6-pin
Figure 4 illustrates the 5 x 7 mm PCB land pattern for the Si515. Table 15 lists the values for the dimensions shown
in the illustration.
Figure 4. Si515 PCB Land Pattern
Table 15. PCB Land Pattern Dimensions (mm)
Dimension (mm)
C1 4.20
E5.08
X1 1.55
Y1 1.95
Notes:
General
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and Tolerancing is per the ANSI Y14.5M-1994 specification.
3. This Land Pattern Design is based on the IPC-7351 guidelines.
4. All dimensions shown are at Maximum Material Condition (MMC). Least Material Condition
(LMC) is calculated based on a Fabrication Allowance of 0.05 mm.
Solder Mask Design
5. All metal pads are to be non-solder mask defined (NSMD). Clearance between the solder
mask and the metal pad is to be 60 µm minimum, all the way around the pad.
Stencil Design
6. A stainless steel, laser-cut and electro-polished stencil with trapezoidal walls should be used
to assure good solder paste release.
7. The stencil thickness should be 0.125 mm (5 mils).
8. The ratio of stencil aperture to land pad size should be 1:1.
Card Assembly
9. A No-Clean, Type-3 solder paste is recommended.
10. The recommended card reflow profile is per the JEDEC/IPC J-STD-020 specification for
Small Body Components.
Si515
Rev. 1.0 17
6. Package Outline Diagram: 3.2 x 5.0 mm, 6-pin
Figure 5 illustrates the package details for the 3.2 x 5 mm Si510/511. Table 16 lists the values for the dimensions
shown in the illustration.
Figure 5. Si510/511 Outline Diagram
Table 16. Package Diagram Dimensions (mm)
Dimension Min Nom Max
A1.061.171.28
b0.540.640.74
c0.350.450.55
D 3.20 BSC
D1 2.55 2.60 2.65
e 1.27 BSC
E 5.00 BSC
E1 4.35 4.40 4.45
H0.450.550.65
L0.901.001.10
L1 0.05 0.10 0.15
p1.171.271.37
R0.32 REF
aaa 0.15
bbb 0.15
ccc 0.10
ddd 0.10
eee 0.05
Notes:
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and Tolerancing per ANSI Y14.5M-1994.
Si515
18 Rev. 1.0
7. PCB Land Pattern: 3.2 x 5.0 mm, 6-pin
Figure 6 illustrates the recommended 3.2 x 5 mm PCB land pattern for the Si515. Table 17 lists the values for the
dimensions shown in the illustration.
Figure 6. Si515 PCB Land Pattern
Table 17. PCB Land Pattern Dimensions (mm)
Dimension (mm)
C1 2.60
E1.27
X1 0.80
Y1 1.70
Notes:
General
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and Tolerancing is per the ANSI Y14.5M-1994 specification.
3. This Land Pattern Design is based on the IPC-7351 guidelines.
4. All dimensions shown are at Maximum Material Condition (MMC). Least Material
Condition (LMC) is calculated based on a Fabrication Allowance of 0.05 mm.
Solder Mask Design
5. All metal pads are to be non-solder mask defined (NSMD). Clearance between the
solder mask and the metal pad is to be 60 µm minimum, all the way around the pad.
Sten cil Desig n
6. A stainless steel, laser-cut and electro-polished stencil with trapezoidal walls should be
used to assure good solder paste release.
7. The stencil thickness should be 0.125 mm (5 mils).
8. The ratio of stencil aperture to land pad size should be 1:1.
Card Assembly
9. A No-Clean, Type-3 solder paste is recommended.
10. The recommended card reflow profile is per the JEDEC/IPC J-STD-020 specification
for Small Body Components.
Si515
Rev. 1.0 19
8. Top Marking
Use the part number configuration utility located at: www.silabs.com/VCXOPartNumber to cross-reference the
mark code to a specific device configuration.
8.1. Si515 Top Marking
8.2. Top Marking Explanation
Mark Method: Laser
Line 1 Marking: 5 = Si515
CCCCC = Mark Code
5CCCCC
Line 2 Marking: TTTTTT = Assembly Manufacturing Code TTTTTT
Line 3 Marking: Pin 1 indicator. Circle with 0.5 mm diameter;
left-justified
YY = Year.
WW = Work week.
Characters correspond to the year and
work week of package assembly.
YYWW
5CCCCC
TTTTTTYYWW
Si515
20 Rev. 1.0
DOCUMENT CHANGE LIST
Revision 0.9 to Revision 1.0
Updated Table 1 on page 4.
Updates to supply current typical and maximum values
for CMOS, LVDS, LVPECL and HCSL.
CMOS frequency test condition corrected to 100 MHz.
Updates to OE VIH minimum and VIL maximum values.
Updated Table 3 on page 5.
Dual CMOS nominal frequency maximum added.
Disable time maximum values updated.
Enable time parameter added.
Updated Table 4 on page 6.
CMOS output rise / fall time typical and maximum
values updated.
LVPECL/HCSL output rise / fall time maximum value
updated.
LVPECL output swing maximum value updated.
LVDS output common mode typical and maximum
values updated.
HCSL output swing maximum value updated.
Duty cycle minimum and maximum values tightened to
48/52%.
Updated Table 5 on page 7.
Phase jitter test condition, typical and maximum value
updated.
Phase noise typical values updated.
Additive RMS jitter due to external power supply noise
typical values updated.
Added Tables 6, 7, 8 for LVDS, HCSL, CMOS and
Dual CMOS operations.
Added note to Figure 2 clarifying CMOS and Dual
CMOS maximum frequency.
Updated Figure 5 outline diagram to correct pinout.
Updated “8. Top Marking” section and moved to
page 19.
Si515
Rev. 1.0 21
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