CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Four Output Clock Generator/Jitter Cleaner With Integrated Dual VCOs Check for Samples: CDCE62002 FEATURES 1 * * * * * * * * Frequency Synthesizer With PLL/VCO and Partially Integrated Loop Filter Fully Configurable Outputs Including Frequency and Output Format Smart Input Multiplexer Automatically Switches Between one of two Reference Inputs. Multiple Operational Modes Include Clock Generation via Crystal, SERDES Startup Mode, Jitter Cleaning, and Oscillator Based Holdover Mode. Integrated EEPROM Determines Device Configuration at Power-up. Excellent Jitter Performance Integrated Frequency Synthesizer Including PLL, Multiple VCOs, and Loop Filter: - Full Programmability Facilitates Phase Noise Performance Optimization Enabling Jitter Cleaner Mode - Programmable Charge Pump Gain and Loop Filter Settings - Unique Dual-VCO Architecture Supports a Wide Tuning Range 1.750 GHz - 2.356 GHz. Universal Output Blocks Support up to 2 Differential, 4 Single-Ended, or Combinations of Differential or Single-Ended: - 0.5 ps RMS (10 kHz to 20 MHz) Output Jitter Performance - Low Output Phase Noise: -130 dBc/Hz at 1 MHz offset, Fc = 491.52 MHz - Output Frequency Ranges From 10.94 MHz to 1.175 GHz in Synthesizer Mode - LVPECL, LVDS and LVCMOS - Independent Output Dividers Support Divide Ratios for 1, 2, 3, 4, 5, 8, 10, 12, 16, 20, 24 and 32. * * * * * * Flexible Inputs With Innovative Smart Multiplexer Feature: - Two Universal Differential Inputs Accept Frequencies from 1 MHz up to 500 MHz (LVPECL), 500 MHz (LVDS), or 250 MHz (LVCMOS). - One Auxiliary Input Accepts Crystals in the Range of 2MHz-42MHz - Clock Generator Mode Using Crystal Input - Smart Input Multiplexer can be Configured to Automatically Switch Between Highest Priority Clock Source Available Allowing for Fail-Safe Operation. Typical Power Consumption 750mW at 3.3V Integrated EEPROM Stores Default Settings; Therefore, the Device can Power up in a Known, Predefined State. Offered in QFN-32 Package ESD Protection Exceeds 2kV HBM Industrial Temperature Range -40C to 85C APPLICATIONS * * * * * * * Data Converter and Data Aggregation Clocking Wireless Infrastructure Switches and Routers Medical Electronics Military and Aerospace Industrial Clock Generation and Jitter Cleaning 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright (c) 2009-2012, Texas Instruments Incorporated CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. DESCRIPTION The CDCE62002 is a high performance clock generator featuring low output jitter, a high degree of configurability via a SPI interface, and programmable start up modes determined by on-chip EEPROM. Specifically tailored for clocking data converters and high-speed digital signals, the CDCE62002 achieves jitter performance under 0.5 ps RMS (1). It incorporates a synthesizer block with partially integrated loop filter, a clock distribution block including programmable output formats, and an input block featuring an innovative smart multiplexer. The clock distribution block includes two individually programmable outputs that can be configured to provide different combinations of output formats (LVPECL, LVDS, LVCMOS). Each output can also be programmed to a unique output frequency (ranging from 10.94 MHz to 1.175 GHz (2)). If Both outputs are configured in single-ended mode (e.g., LVCMOS), the CDCE62002 supports up to four outputs. The input block includes one universal differential inputs which support frequencies up to 500 MHz and an auxiliary input that can be configured to connect to an external AT-Cut crystal via an on board oscillator block. The smart input multiplexer has two modes of operation, manual and automatic. In manual mode, the user selects the synthesizer reference via the SPI interface. In automatic mode, the input multiplexer will automatically select between the highest priority input clock available. Data SERDES Cleaned Clock ASIC ASIC Clock Recovered Clock CDCE62002 Figure 1. CDCE62002 Application Example (1) (2) 2 10 kHz to 20 MHz integration bandwidth. Frequency range depends on operational mode and output format selected. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com DEVICE INFORMATION VCC_VCO REG_CAP4 VCC_PLLDIV GND_PLLDIV REG_CAP3 TESTSYNC SPI_LE SPI_CLK RHB PACKAGE (TOP VIEW) 24 23 22 21 20 19 18 17 16 VCC_OUT1 15 U1P 27 14 U1N VCC_PLLA 28 13 VCC_OUT1 REF_IN+ 29 12 VCC_OUT0 REF_IN- 30 11 U0P 10 U0N 32 9 1 2 3 4 5 6 7 8 SPI_MOSI PLL _LOCK SPI_MISO 31 PD VCC_IN Thermal Pad (must be soldered to ground) REG_CAP1 REG_CAP2 5mm x 5mm 32 pin QFN VCC_PLLD 26 VBB EXT_LFN AUX_IN 25 VCC_AUX EXT_LFP VCC_OUT0 PIN FUNCTIONS Table 1. CDCE62002 Pin Functions (1) PIN NAME QFN VCC_OUT0 9, 12 VCC_OUT1 13, 16 TYPE DESCRIPTION Power 3.3V Supply for the Output Buffers. VCC_PLLDIV 22 Power 3.3V Supply Power for the PLL circuitry. VCC_PLLD 4 Power 3.3V Supply Power for the PLL circuitry. VCC_PLLA 28 A. Power 3.3V Supply Power for the PLL circuitry. VCC_VCO 24 A. Power 3.3V Supply Power for the VCO Circuitry. VCC_IN 31 A. Power 3.3V Supply Power for Input Buffer Circuitry VCC_AUX 1 A. Power 3.3V Supply Power for Crystal/Auxiliary Input Buffer Circuitry GND_PLLDIV 21 Ground Ground for PLL Divider circuitry. (short to GND) PAD Ground Ground is on Thermal PAD. See Layout recommendation 7 O GND SPI_MISO (1) 3-state LVCMOS Output that is enabled when SPI_LE is asserted low. It is the serial Data Output to the SPI bus interface. It is furthermore recommended to use a supply filter for each VCC supply domain independently. A minimum requirement is to group the supplies into four independent groups: VCC_PLLA + VCC_VCO VCC_PLLD + VCC_PLLDIV VCC_IN + VCC_AUXIN VCC_OUT0 + VCC_OUT1 All VCC pins need to be connected for the device to operate properly. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 3 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 1. CDCE62002 Pin Functions(1) (continued) PIN NAME QFN TYPE DESCRIPTION SPI_LE 18 I LVCMOS input, control Latch Enable for Serial Programmable Interface. Note: The SPI_LE signal has to be high in order for the EEPROM to load correctly on the Rising edge of PD. The input has an internal 150-k pull-up resistor SPI_CLK 17 I LVCMOS input, serial Control Clock Input for the SPI bus interface, with Hysteresis. SPI_MOSI 8 I LVCMOS input, Master Out Slave In as a serial Control Data Input to CDCE62002 for the SPI bus interface. PD or Power Down Pin is an active low pin and can be activated externally or via the corresponding Bit in SPI Register 2 PD 6 I While PD is asserted (low), the device is shut down. When PD switches high the EEPROM becomes loaded into the RAM. After the selected input clock signal becomes available, the VCO starts calibration and the PLL aims to achieve lock. All Output dividers become initiated. During self-calibration, the outputs are held static (e.g. logical zero). PD pin has an internal 150-k pull-up resistor. Note: The SPI_LE signal has to be high in order for the EEPROM to load correctly into RAM on the Rising edge of PD. AUX_IN 2 I Auxiliary Input is a Crystal input pin that connect to an internal oscillator circuitry. REF_IN+ 29 I Universal Input Buffer (LVPECL, LVDS, LVCMOS) positive input for the Reference Clock. REF_IN- 30 I Universal Input Buffer (LVPECL, LVDS,) negative input for the Reference Clock. This pin must be pulled to ground through 1k resistor when input is selected LVCMOS. PLL_LOCK 32 O PLL Lock indicator TESTSYNC 19 I Reserved Pin. Pull this pin down to ground using 1k resistor. REG_CAP1 5 Analog Capacitor for the internal Regulator. Connect to a 10 F Capacitor (Y5V) REG_CAP2 27 Analog Capacitor for the internal Regulator. Connect to a 10 F Capacitor (Y5V) REG_CAP3 20 Analog Capacitor for the internal Regulator. Connect to a 10 F Capacitor (Y5V) REG_CAP4 23 Analog Capacitor for the internal Regulator. Connect to a 10 F Capacitor (Y5V) VBB 3 Analog Capacitor for the internal termination Voltage. Connect to a 1 F Capacitor (Y5V) EXT_LFP 25 Analog External Loop Filter Input Positive EXT_LFN 26 Analog External Loop Filter Input Negative. U0P:U0N U1P:U1N 11,10 15,14 O 4 The outputs of CDCE62002 are user definable and can be any combination of up to 2 LVPECL outputs, 2 LVDS outputs or up to 4 LVCMOS outputs. The outputs are selectable via SPI interface. The power-up setting is EEPROM configurable. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com FUNCTIONAL DESCRIPTION EXT _LFP EXT _LFN REF_IN Output Divider 0 Reference Divider XTAL / AUX _IN Output Divider 1 Input Divider PFD / CP Feedback Divider PD SPI_LE SPI _CLK SPI _MOSI SPI _MISO Interface & Control U0 P U0N U1 P U1N Prescaler EEPROM Figure 2. CDCE62002 Block Diagram The CDCE62002 comprises of four primary blocks: the interface and control block, the input block, the output block, and the synthesizer block. In order to determine which settings are appropriate for any specific combination of input/output frequencies, a basic understanding of these blocks is required. The interface and control block determines the state of the CDCE62002 at power-up based on the contents of the on-board EEPROM. In addition to the EEPROM, the SPI port is available to configure the CDCE62002 by writing directly to the device registers after power-up. The input block selects which of the two input ports is available for use by the synthesizer block. The output block provides two separate clock channels that are fully programmable. The synthesizer block multiplies and filters the input clock selected by the input block. NOTE This Section of the data sheet provides a high-level description of the features of the CDCE62002 for purpose of understanding its capabilities. For a complete description of device registers and I/O, refer to the Device Configuration Section. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 5 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Interface and Control Block The CDCE62002 is a highly flexible and configurable architecture and as such contains a number of registers so that the user may specify device operation. The contents of three 28-bit wide registers implemented in static RAM determine device configuration at all times. On power-up, the CDCE62002 copies the contents of the EEPROM into the RAM and the device begins operation based on the default configuration stored in the EEPROM. Systems that do not have a host system to communicate with the CDCE62002 use this method for device configuration. After power-up, the host system may overwrite the contents of the RAM via the SPI (Serial Peripheral Interface) port. This enables the configuration and reconfiguration of the CDCE62002 during system operation. Finally, the device offers the ability to copy the contents of the RAM into EEPROM PD SPI_ LE SPI_ CLK SPI_ MOSI SPI_ MISO Static RAM Device Registers Register 2 Interface & Control Device Hardware Register 1 Register 0 EEPROM Device Registers Register 1 Register 0 Figure 3. CDCE62002 Interface and Control Block Input Block The Input Block includes one Universal Input Buffer and an Auxiliary Input. The Input Block buffers the incoming signals and facilitates signal routing to the Internal Synthesizer Block via the smart multiplexer (called the Smart MUX). The CDCE62002 can divide the REF_IN signal via the dividers present on the inputs of the first stage of the Smart MUX. Smart MUX Control LVPECL/LVDS 500 MHz LVCMOS 250 MHz Crystal : 2 MHz - 42 MHz REF_IN Reference Divider /1 - /8 Synthesizer Reference XTAL/ AUX_IN Figure 4. CDCE62002 Input Block 6 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Synthesizer Block Figure 5 presents a high-level overview of the Synthesizer Block on the CDCE62002. This block contains the Phase lock loop, internal loop filter and dual Voltage controlled oscillators. Only one VCO is selected at a time. The loop is closed after a Prescaler divider that feeds the output stage the feedback divider. SMART_MUX 1.75 GHz - 2.356 GHz Input Divider /1 - /256 PFD/ CP Prescaler /2,/3,/4,/5 SYNTH /1,/2,/5,/8,/10,/16,/20 Feedback Bypass Divider /8 - /1280 Feedback Divider Figure 5. CDCE62002 Synthesizer Block Output Block Both identical output blocks incorporate a Clock Divider Module (CDM), and a universal output buffer. If an individual clock output channel is not used, then the user should disable the Output Buffer for the unused channel to save device power. Each channel includes 4-bit in register "0" to control the divide ratio. The output divider supports divide ratios from divide of 1 (bypass the divider) 2, 3, 4, 5, 8, 10, 12, 16, 20, 24 and 32. Sync Pulse Output Buffer Control Enable Digital Phase Adjust (7-bits) UxP SYNTH /1,2,3,4,5 Clock Divider /1 - /8Module 0/2& 1 LVDS UxN LVPECL Figure 6. CDCE62002 Output Block Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 7 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com COMPUTING THE OUTPUT FREQUENCY Figure 7 presents the block diagram of the CDCE62002 synthesizer highlighting the clock path for a single output. It also identifies the following regions containing dividers comprising the complete clock path: * R: Is the Reference divider values. * O: The output divider value (see Output Block for more details) * I: The input divider value (see Synthesizer Block for more details) * P: The Prescaler divider value (see Synthesizer Block of more details) * F: The cumulative divider value of all dividers falling within the feedback divider (see Synthesizer Block for more details) R Reference Divider Fin O Output Divider 0 EXT_LFP EXT_LFN U0P F OUT U0N I P Input Divider Feedback Divider PFD/ CP Prescaler Output Divider 1 U1P U1N F Figure 7. CDCE62002 Clock Path - Synthesizer With respect to Figure 7, any output frequency generated by the CDCE62002 relates to the input frequency connected to the Synthesizer Block by the following equation: FOUT = FIN x F R xIx O (1) Equation 1 holds true subject to the following constraints: 1.750GHz < O x P x FOUT < 2.356GHz (2) And the comparison frequency FCOMP, 40.0 kHz FCOMP 40 MHz Where: FCOMP = FIN R xI (3) When AUX_IN is selected as the input, R can be set to 1 in Equation 1 and Equation 3. 8 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) VALUE / UNIT Supply voltage range VCC Input voltage range, VI (2) -0.5 V to 4.6 V (3) Output voltage range, VO -0.5 V to VCC + 0.5 V (3) -0.5 V to VCC + 0.5 V Input Current (VI < 0, VI > VCC) 20 mA Output current for LVPECL/LVCMOS Outputs (0 < VO < VCC) 50 mA Maximum junction temperature, TJ 125C -65C to 150C Storage temperature range, Tstg (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All supply voltages have to be supplied simultaneously. The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed. (2) (3) THERMAL CHARACTERISTICS Package Thermal Resistance for QFN (RGZ) Package JP (C/W) JA (C/W) 0 JEDEC Compliant Board (3X3 VIAs on PAD) 1.13 35 200 JEDEC Compliant Board (3X3 VIAs on PAD) 1.13 28.3 400 JEDEC Compliant Board (3X3 VIAs on PAD) 1.13 27.2 Airflow (lfm) PACKAGE The CDCE62002 is packaged in a 32-Pin Lead Free "Green" Plastic Quad Flatpack Package with enhanced bottom thermal pad for heat dissipation. The Texas Instruments Package Designator is; RHB (S-PQFP-N32). Please refer to the Mechanical Data appendix at the end of this document for more information. ELECTRICAL CHARACTERISTICS recommended operating conditions for the CDCE62002 Device for under the specified Industrial temperature range of -40C to 85C MIN TYP (1) MAX Supply voltage, VCC_OUT, VCC_PLLDIV, VCC_PLLD, VCC_IN, and VCC_AUX 3 3.3 3.6 Analog Supply Voltage, VCC_PLLA, & VCC_VCO 3 3.3 3.6 PARAMETER TEST CONDITIONS UNIT POWER SUPPLY PLVPECL REF at 30.72MHz, Outputs are LVPECL PLVDS REF at 30.72MHz, Outputs are LVDS PLVCMOS POFF V V 850 mW 750 mW REF at 30.72MHz, Outputs are LVCMOS Output 1 = 491.52 MHz Output 2 = 245.76 MHz In case of LVCMOS Outputs (1) = 245.76MHz 800 mW REF at 30.72MHz Outputs are disabled 450 mW 40 mW PPD Device is Powered Down DIFFERENTIAL INPUT MODE (REF_IN) Differental Input amplitude, (VIN+ - VIN-) 0.1 1.3 V Common-mode input voltage, VIC 1.0 VCC-03 V 20 A IIH Differential input current High (No internal Termination) VI = VCC, VCC = 3.6 V IIL Differential input current Low (No internal Termination) VI = 0 V, VCC = 3.6 V -20 Input Capacitance on REF_IN A 3 pF CRYSTAL INPUT SPECIFICATIONS On-chip Load Capacitance 8 Equivalent Series Resistance (ESR) (1) 10 pF 50 All typical values are at VCC = 3.3 V, temperature = 25C. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 9 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (continued) recommended operating conditions for the CDCE62002 Device for under the specified Industrial temperature range of -40C to 85C PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT LVCMOS INPUT MODE (SPI_CLK,SPI_MOSI,SPI_LE,PD, REF_IN) VIL Low-level input voltage LVCMOS 0 0.3 VCC V VIH High-level input voltage LVCMOS 0.7 VCC VCC V VIK LVCMOS input clamp voltage VCC = 3 V, II = -18 mA IIH LVCMOS input current VI = VCC, VCC = 3.6 V IIL LVCMOS input (Except REF_IN) VI = 0 V, VCC = 3.6 V IIL LVCMOS input (REF_IN) VI = 0 V, VCC = 3.6 V CI Input capacitance (LVCMOS signals) VI = 0 V or VCC = 3 -1.2 V 20 A -10 -40 A -10 10 A 3 pF SPI OUTPUT (MISO) / PLL_LOCK IOH High-level output current VCC = 3.3 V, VO = 1.65 V -30 mA IOL Low-level output current VCC = 3.3 V, VO = 1.65 V 33 mA VOH High-level output voltage for LVCMOS outputs VCC = 3 V, IOH = -100 A VOL Low-level output voltage for LVCMOS outputs VCC = 3 V, IOH = 100 A CO Output capacitance o MISO VCC = 3.3 V; VO = 0 V or VCC IOZH 3-state output current IOZL VCC-0.5 V 0.3 VO = VCC, VO = 0 V V 3 pF 5 A -5 A EEPROM EEcyc Programming cycle of EEPROM EEret Data retention 100 1000 Cycles 10 Years VBB ( INPUT BUFFER INTERNAL TERMINATION VOLTAGE REFERENCE) VBB Input termination voltage IBB = -0.2 mA, Depending on the setting 1.2 1.9 V INPUT BUFFERS INTERNAL TERMINATION RESISTORS (REF_IN) Termination resistance Single ended 5 k PHASE DETECTOR fCPmax 10 Charge pump frequency 0.04 Submit Documentation Feedback 40 MHz Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (Continued) recommended operating conditions for the CDCE62002 Device for under the specified Industrial temperature range of -40C to 85C PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT 250 MHz LVCMOS fclk Output frequency, see Figure below Load = 5 pF to GND VOH High-level output voltage for LVCMOS outputs VCC = min to max IOH = -100 A VOL Low-level output voltage for LVCMOS outputs VCC = min to max IOL = 100 A IOH High-level output current VCC = 3.3 V VO = 1.65 V -30 mA IOL Low-level output current VCC = 3.3 V VO = 1.65 V 33 mA tsko Skew, output to output For Y0 to Y1 Both Outputs set at 122.88 MHz, Reference = 30.72 MHz 75 ps CO Output capacitance on Y0 to Y1 VCC = 3.3 V; VO = 0 V or VCC 5 pF IOZH Tristate LVCMOS output current VO = VCC 5 A IOZL Tristate LVCMOS output current VO = 0 V -5 IOPDH Power Down output current VO = VCC 25 A IOPDL Power Down output current VO = 0 V 5 A Duty cycle LVCMOS tslew-rate Output rise/fall slew rate (1) VCC-0 .5 V 0.3 45% 3.6 V A 55% 5.2 V/ns All typical values are at VCC = 3.3 V, temperature = 25C. LVCMOS 5 pF Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 11 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (Continued) recommended operating conditions for the CDCE62002 Device for under the specified Industrial temperature range of -40C to 85C PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT 0 800 MHz 270 550 mV 50 mV LVDS OUTPUT fclk Output frequency Configuration Load (see Figure below) |VOD| Differential output voltage RL = 100 VOD LVDS VOD Magnitude Change VOS Offset Voltage VOS VOS Magnitude Change -40C to 85C 1.24 V 40 mV Short Circuit Vout+ to Ground VOUT = 0 27 mA Short Circuit Vout- to Ground VOUT = 0 27 mA tsk(o) Skew, output to output For Y0 to Y1 Both Outputs set at 122.88 MHz Reference = 30.72 MHz CO Output capacitance on Y0 to Y1 VCC = 3.3 V; VO = 0 V or VCC IOPDH Power Down output current VO = VCC 25 A IOPDL Power Down output current VO = 0 V 5 A Duty Cycle tr / tf 10 ps 5 pF 45% Rise and fall time 20% to 80% of VOPP 55% 110 160 190 ps 1.4 1.7 2.0 ns LVCMOS-TO-LVDS tskP_C (1) Output skew between LVCMOS and LVDS outputs VCC/2 to Crosspoint All typical values are at VCC = 3.3 V, temperature = 25C. LVDS DC Termination Test 100 12 Oscilloscope Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com ELECTRICAL CHARACTERISTICS (Continued) recommended operating conditions for the CDCE62002 Device for under the specified Industrial temperature range of -40C to 85C PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT MHz LVPECL OUTPUT fclk Output frequency Configuration Load (see Figure below) 0 1175 VOH LVPECL high-level output voltage Load VCC -1.1 VCC -0.88 VOL LVPECL low-level output voltage Load VCC -2.02 VCC -1.48 |VOD| Differential output voltage 510 870 tsko Skew, output to output For Y0 to Y1 Both Outputs set at 122.88 MHz CO Output capacitance on Y0 to Y1 VCC = 3.3 V; VO = 0 V or VCC IOPDH Power Down output current VO = VCC 25 A IOPDL Power Down output current VO = 0 V 5 A Duty Cycle tr / tf 20% to 80% of VOPP V mV 15 ps 5 pF 45% Rise and fall time V 55% 55 75 135 ps 130 200 280 ps 1.6 1.8 2.2 ns V LVDS-TO- LVPECL tskP_C Output skew between LVDS and LVPECL outputs Crosspoint to Crosspoint LVCMOS-TO- LVPECL tskP_C Output skew between LVCMOS and LVPECL outputs VCC/2 to Crosspoint LVPECL Hi-PERFORMANCE OUTPUT VOH LVPECL high-level output voltage Load VCC -1.11 VCC -0.91 VOL LVPECL low-level output voltage Load VCC -2.06 VCC -1.84 |VOD| Differential output voltage 670 950 mV tr / tf Rise and fall time 135 ps (1) 20% to 80% of VOPP 55 75 V All typical values are at VCC = 3.3 V, temperature = 25C. LVPECL AC Termination Test LVPECL DC Termination Test 50W Oscilloscope 50W 150W 150W 50W Oscilloscope 50W Vcc-2 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 13 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com HIGH-PERFORMANCE LVPECL OUTPUT VOLTAGE SWING vs FREQUENCY LVPECL OUTPUT VOLTAGE SWING vs FREQUENCY TA = 25C RL = 50 to VCC - 2 V 950 LVPECL Output Voltage Swing - mV High-Performance LVPECL Output Voltage Swing - mV 1000 900 850 800 VCC = 3.6 V 750 700 650 VCC = 3.3 V 600 550 VCC = 3 V 500 450 0 200 400 600 800 1000 1200 TA = 25C RL = 50 to VCC - 2 V 1150 1100 1050 1000 VCC = 3.6 V 950 900 850 VCC = 3.3 V 800 750 VCC = 3 V 700 650 0 1200 200 400 600 800 1000 G002 G001 Figure 8. Figure 9. LVDS OUTPUT VOLTAGE SWING vs FREQUENCY LVCMOS OUTPUT VOLTAGE SWING vs FREQUENCY 500 3.8 TA = 25C RL = 100 3.7 450 LVCMOS Output Voltage Swing - V LVDS Output Voltage Swing - mV 475 425 400 VCC = 3.6 V 375 VCC = 3.3 V 350 325 VCC = 3 V 300 275 250 TA = 25C CL = 5 pF VCC = 3.6 V 3.6 3.5 3.4 VCC = 3.3 V 3.3 3.2 3.1 VCC = 3 V 3.0 2.9 2.8 225 2.7 0 100 200 300 400 500 600 700 800 900 50 f - Frequency - MHz 100 150 200 250 300 f - Frequency - MHz G003 Figure 10. 14 1200 f - Frequency - MHz f - Frequency - MHz G004 Figure 11. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com TIMING REQUIREMENTS over recommended ranges of supply voltage, load and operating free-air temperature range (unless otherwise noted) PARAMETER MIN TYP MAX UNIT REF_IN REQUIREMENTS fREF - Diff IN-DIV Maximum clock frequency applied to reference divider when (Register 0 Bit 9 = 1) 500 MHz fREF - Diff REF_DIV Maximum clock frequency applied to reference divider when (Register 0 Bit 9 = 0) 250 MHz fREF- Single For Single ended Inputs ( LVCMOS) on REF_IN 250 MHz Duty Cycle Duty cycle of REF_IN 40% 60% INTERNAL TIMING REQUIREMENTS fSMUX Maximum clock frequency applied to Smart MUX input 250 MHz fINDIV Maximum clock frequency applied to Input Divider 200 MHz 42 MHz AUXILARY_IN REQUIREMENTS fREF - Crystal AT-Cut Crystal Input 2 Drive Level 0.1 mW Maximum shunt capacitance 7 pF 4 ns PD REQUIREMENTS tr / tf Rise and fall time of the PD signal from 20% to 80% of VCC PHASE NOISE ANALYSIS Table 2. Phase Noise for 30.72MHz External Reference Phase Noise Specifications under following configuration: VCO = 1966.08 MHz, REF_IN = 30.72MHz, PFD Frequency = 30.72MHz, Charge Pump Current = 1.5mA Loop BW = 400kHz at 3.3V and 25C. Reference 30.72MHz LVPECL-HP 491.52MHz LVPECL 491.52MHz LVDS 491.52MHz LVCMOS 122.88MHz UNIT 10Hz -108 -84 -84 100Hz -130 -98 -98 -85 -97 dBc/Hz -97 -111 1kHz -134 -106 dBc/Hz -106 -106 -118 10kHz -152 dBc/Hz -118 -118 -118 -130 100kHz dBc/Hz -156 -121 -121 -121 -133 dBc/Hz 1MHz -157 -131 -131 -130 -142 dBc/Hz 10MHz -- -146 -146 -145 -151 dBc/Hz 20MHz -- -146 -146 -145 -151 dBc/Hz 195 (10k~1MHz) 319 316 332.2 372.1 fs PHASE NOISE AT Jitter(RMS) 10k~20MHz Table 3. Phase Noise for 25MHz Crystal Reference Phase Noise Specifications under following configuration: VCO = 2000.00 MHz, AUX_IN-REF = 25.00MHz, PFD Frequency = 25.00MHz, Charge Pump Current = 1.5mA Loop BW = 400kHz 3.3V and 25C. LVPECL-HP 500.00MHz LVDS 250.00MHz LVCMOS 125.00MHz UNIT 10Hz -72 100Hz -97 -72 -79 dBc/Hz -97 -103 1kHz dBc/Hz -111 -111 -118 dBc/Hz 10kHz -120 -120 -126 dBc/Hz 100kHz -124 -124 -130 dBc/Hz 1MHz -136 -136 -142 dBc/Hz 10MHz -147 -147 -151 dBc/Hz 20MHz -148 -148 -151 dBc/Hz Jitter(RMS) 10k~20MHz 426 426 443 fs PHASE NOISE AT Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 15 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com OUTPUT TO OUTPUT ISOLATION Table 4. Output to Output Isolation WORST SPUR UNIT The Output to Output Isolation was tested at 3.3V supply and 25C ambient temperature (Default Configuration): Output 1 Measured Channel In LVDS Signaling at 125MHz Output 0 Aggressor Channel LVPECL 156.25MHz -70 dB DEVICE CONFIGURATION The Functional Description Section described four different functional blocks contained within the CDCE62002. Figure 12 depicts these blocks along with a high-level functional block diagram of the circuit elements comprising each block. The balance of this section focuses on a detailed discussion of each functional block from the perspective of how to configure them. Input Block Synthesizer Block Output Blocks Output Channel 0 Smart MUX Frequency Synthesizer Output Channel 1 Interface & Control Device Registers Interface & Control Block EEPROM Figure 12. CDCE62002 Circuit Blocks 16 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com INTERFACE AND CONTROL BLOCK The Interface and Control Block includes a SPI interface, one control pin, a non-volatile memory array in which the device stores default configuration data, and an array of device registers implemented in Static RAM. This RAM, also called the device registers, configures all hardware within the CDCE62002. SPI (Serial Peripheral Interface) The serial interface of CDCE62002 is a simple bidirectional SPI interface for writing and reading to and from the device registers. It implements a low speed serial communications link in a master/slave topology in which the CDCE62002 is a slave. The SPI consists of four signals: * SPI_CLK:Serial Clock (Output from Master) - the CDCE62002 and the master host clock data in and out on the rising edge of SPI_CLK. Data transitions therefore occur on the falling edge of the clock. (LVCMOS Input Buffer) * SPI_MOSI: Master Output Slave Input (LVCMOS Input Buffer). * SPI_MISO: Master Input Slave Output (Open Drain LVCMOS Buffer) * SPI_LE: Latch Enable (Output from Master). The falling edge of SPI_LE initiates a transfer. If SPI_LE is high, no data transfer can take place. (LVCMOS Input Buffer). SPI Interface Master The Interface master can be designed using a FPGA or a micro controller. The CDCE62002 acts as a slave to the SPI master and only supports nonconsecutive read and write command. The SPI clock should start and stop with respect to the SPI_LE signal as shown in Figure 13 SPI_MOSI, SPI_CLK and SPI_LE are generated by the SPI Master. SPI_MISO is generated by the SPI slave the CDCE62002. SPI_MISO SPI_MISO SPI_MOSI SPI_MOSI SPI_CLK SPI_LE SPI_CLK SPI_LE SPI_MISO SPI_MOSI SPI_CLK SPI_LE Figure 13. CDCE62002 SPI Read/Write Command SPI Consecutive Read/Write Cycles to the CDCE62002 Figure 14 Illustrates how two consecutive SPI cycles are performed between a SPI Master and the CDCE62002 SPI Slave. SPI Master SPI Slave SPI_MISO SPI_MOSI SPI_CLK SPI_LE Figure 14. Consecutive Read/Write Cycles Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 17 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Writing to the CDCE62002 Figure 15 illustrates a Write to RAM operation. Notice that the latching of the first data bit in the data stream (Bit 0) occurs on the first rising edge of SPI_CLK after SPI_LE transitions from a high to a low. For the CDCE62002, data transitions occur on the falling edge of SPI_CLK. A rising edge on SPI_LE signals to the CDCE62002 that the transmission of the last bit in the stream (Bit 31) has occurred. SPI _CLK Bit 0 SPI _MOSI Bit1 Bit 29 Bit 30 Bit31 SPI _LE Figure 15. CDCE62002 SPI Write Operation Reading from the CDCE62002 Figure 16 shows how the CDCE62002 executes a Read Command. The SPI master first issues a Read Command to initiate a data transfer from the CDCE62002 back to the host (see Table 5). This command specifies the address of the register of interest. By transitioning SPI_LE from a low to a high, the CDCE62002 resolves the address specified in the appropriate bits of the data field. The host drives SPI_LE low and the CDCE62002 presents the data present in the register specified in the Read Command on SPI_MISO. SPI _CLK SPI _MOSI Bit30 Bit31 SPI _MISO Bit0 Bit1 SPI _LE Figure 16. CDCE62002 SPI Read Operation Writing to EEPROM After the CDCE62002 detects a power-up and completes a reset cycle, the device copies the contents of the on-chip EEPROM into the Device Registers. (SPI_LE signal has to be HIGH in order for the EEPROM to load correctly during the rising edge of Power_Down signal). The host issues a special commands shown in Figure 17 to copy the contents of Device Registers 0 and 1into EERPOM. * Copy RAM to EEPROM - Unlock, Execution of this command can happen many times. After the command is initiated, power must remain stable and the host must not access the CDCE62002 for at least 50 ms to allow the EEPROM to complete the write cycle and to avoid the possibility of EEPROM corruption. CDCE62002 SPI Command Structure The CDCE62002 supports three commands issued by the Master via the SPI: * Write to RAM * Read Command * Copy RAM to EEPROM - unlock Figure 17 provides a summary of the CDCE62002 SPI command structure. The host (master) constructs a Write to RAM command by specifying the appropriate register address in the address field and appends this value to the beginning of the data field. Therefore, a valid command stream must include 32 bits, transmitted LSB first. The host must issue a Read Command to initiate a data transfer from the CDCE62002 back to the host. This command specifies the address of the register of interest in the data field. 18 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com NOTE: `A' indicates address bits. Figure 17. CDCE62002 SPI Command Structure SPI CONTROL INTERFACE TIMING t4 t1 t5 SPI_CLK t3 t2 SPI_MOSI Bit0 Bit1 Bit29 Bit30 Bit31 t7 SPI_LE t6 Figure 18. Timing Diagram for SPI Write Command t4 t5 SPI_CLK t2 SPI_MOSI t8 t3 Bit30 Bit31 SPI_MOSO t7 Bit0 = 0 Bit1 Bit2 SPI_LE t6 t9 Figure 19. Timing Diagram for SPI Read Command Table 5. SPI Bus Timing Characteristics Parameter MIN TYP MAX UNIT 20 MHz fClock Clock Frequency for the SPI_CLK t1 SPI_LE to SPI_CLK setup time 10 ns t2 SPI_MOSI to SPI_CLK setup time 10 ns t3 SPI_MOSI to SPI_CLK hold time 10 ns t4 SPI_CLK high duration 25 ns Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 19 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 5. SPI Bus Timing Characteristics (continued) Parameter MIN TYP MAX UNIT t5 SPI_CLK low duration 25 ns t6 SPI_CLK to SPI_LE Hold time 10 ns t7 SPI_LE Pulse Width 20 t8 SPI_CLK to MISO data valid 10 ns t9 SPI_LE to SPI_MISO Data Valid 10 ns ns Device Registers: Register 0 address 0x00 Table 6. CDCE62002 Register 0 Bit Definitions REGISTER BIT 20 BIT NAME RELATED BLOCK 0 INBUFSELX INBUFSELX 1 INBUFSELY INBUFSELY 2 REFSEL 3 AUXSEL 4 5 6 REFDIVIDE 0 DESCRIPTION / FUNCTION Input Buffer Select (LVPECL,LVDS or LVCMOS) XY(00 ) Disabled, (01) LVPECL, (10) LVDS, (11) LVCMOS The VBB internal Biasing will be determined from this setting EEPROM EEPROM Smart MUX Bits(2,3) See specific section for more detailed description and configuration setup. 00 - RESERVED 10 - REF_IN Select 01- AUX_IN Select 11 - Auto Select ( Reference then AUX) ACDCSEL Input Buffers If Set to "1" DC Termination, If set to "0" AC Termination EEPROM TERMSEL Input Buffers If Set to "0" Input Buffer Internal Termination Enabled EEPROM EEPROM EEPROM EEPROM Reference Divider Settings ( Refer to Table 11) See specific section for more detailed description and configuration setup. 7 REFDIVIDE 1 8 REFDIVIDE 2 EEPROM 9 REFDIVIDE 3 10 RESERVED Always Set to "0" EEPROM 11 I70TEST TEST Set to "0" for Normal Operation. EEPROM 12 ATETEST TEST Set to "0" for Normal Operation. EEPROM 13 LOCKW(0) PLL Lock Lock-detect window Bit 0 EEPROM 14 LOCKW(1) PLL Lock Lock-detect window Bit 1 EEPROM 15 OUT0DIVRSEL0 Output 0 16 OUT0DIVRSEL1 Output 0 17 OUT0DIVRSEL2 Output 0 18 OUT0DIVRSEL3 Output 0 19 OUT1DIVRSEL0 Output 1 EEPROM EEPROM 20 OUT1DIVRSEL1 Output 1 21 OUT1DIVRSEL2 Output 1 22 OUT1DIVRSEL3 Output 1 23 HIPERORMANCE Output 0 & 1 24 OUTBUFSEL0X Output 0 25 OUTBUFSEL0Y Output 0 26 OUTBUFSEL1X Output 1 27 OUTBUFSEL1Y Output 1 EEPROM Output 0 Divider Settings (Refer to Table 12) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM EEPROM Output 1 Divider Settings (Refer to Table 12) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM High Performance, If this Bit is set to "1": - Increases the Bias in the device to achieve Best Phase Noise on the Output Divider - It changes the LVPECL Buffer to Hi Swing in LVPECL. - It increases the current consumption by 20mA (Typical) - This setting only applies to LVPECL output buffers. If none of these two outputs are LVPECL, this bit should be set to zero. EEPROM Output Buffer mode select for OUTPUT "0 ". (X,Y)=00:Disabled, 01:LVCMOS, 10:LVDS, 11:LVPECL EEPROM Output Buffer mode select for OUTPUT "1 ". (X,Y)=00:Disabled, 01:LVCMOS, 10:LVDS, 11:LVPECL EEPROM Submit Documentation Feedback EEPROM EEPROM Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 7. Reference Input AC/DC Input Termination Table REGISTER BITS REFERENCE INPUT VBB VOLTAGE REF+ TERMINATION REF- TERMINATION 5 GENERATOR 5k to VBB 5k to VBB INTERNAL TERMINATION 0 1 4 External Termination X X X 1 -- OPEN OPEN Disabled 0 0 X X -- OPEN OPEN LVCMOS 1 1 X 0 -- OPEN OPEN LVPECL-AC 0 1 0 0 1.9V CLOSED CLOSED LVPECL-DC 0 1 1 0 1.0V CLOSED CLOSED LVDS-AC 1 0 0 0 1.2V CLOSED CLOSED LVDS-DC 1 0 1 0 1.2V CLOSED CLOSED Device Registers: Register 1 address 0x01 Table 8. CDCE62002 Register 1 Bit Definitions REGISTER BIT BIT NAME RELATED BLOCK DESCRIPTION / FUNCTION VCO Select - See Table 16 for details 0 SELVCO VCO Core 1 SELINDIV0 VCO Core EEPROM EEPROM 2 SELINDIV1 VCO Core EEPROM 3 SELINDIV2 VCO Core EEPROM 4 SELINDIV3 VCO Core 5 SELINDIV4 VCO Core 6 SELINDIV5 VCO Core EEPROM 7 SELINDIV6 VCO Core EEPROM 8 SELINDIV7 VCO Core 9 SELPRESCA VCO Core 10 SELPRESCB VCO Core 11 SELFBDIV0 VCO Core EEPROM 12 SELFBDIV1 VCO Core EEPROM 13 SELFBDIV2 VCO Core EEPROM 14 SELFBDIV3 VCO Core 15 SELFBDIV4 VCO Core 16 SELFBDIV5 VCO Core EEPROM 17 SELFBDIV6 VCO Core EEPROM 18 SELFBDIV7 VCO Core EEPROM 19 SELBPDIV0 VCO Core 20 SELBPDIV1 VCO Core 21 SELBPDIV2 VCO Core 22 LFRCSEL0 VCO Core 23 LFRCSEL1 VCO Core 24 LFRCSEL2 VCO Core 25 LFRCSEL3 VCO Core 26 RESERVED Status TI Use Only; set '0' EEPROM 27 RESERVED Status Read Only; May read back to 1 or 0; set '1' while writing EEPROM Input Divider Settings (Refer to Table 13) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM PRESCALER Setting. (Refer to Table 17) See specific section for more detailed description and configuration setup. FEEDBACK DIVIDER Setting (Refer to Table 14) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM EEPROM EEPROM BYPASS DIVIDER Setting (Refer to Table 15) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM Loop Filter & Charge Pump Control Setting (Refer to Table 18) See specific section for more detailed description and configuration setup. EEPROM EEPROM EEPROM Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 21 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Device Registers: Register 2 address 0x02 Table 9. CDCE62002 Register 2 Bit Definitions REGISTER BIT NAME BIT 22 RELATED BLOCK DESCRIPTION / FUNCTION 0 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 1 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 2 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 3 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 4 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 5 RESERVED Diagnostics 6 PLLLOCKPIN TI Test Registers. For TI Use Only RAM Status Read Only: Status of the PLL Lock Pin Driven by the device. PLL Lock = 1 RAM Control Power Down mode "On" when set to "0", Off when set to "1" is normal operation (PD bit does not load the EEPROM into RAM when set to "1"). RAM Control If toggled "1-0-1" this bit forces "SYNC" resynchronize the Output Dividers. RAM TI Test Registers. For TI Use Only RAM 7 PD 8 SYNC 9 RESERVED Diagnostics 10 VERSION0 Read Only RAM 11 VERSION1 Read Only RAM 12 VERSION2 Read Only RAM 13 CALSELECT VCO Core This bit selects the VCO calibration mode. If CALSELECT = '0' , toggling PD# bit (Register 2 bit 7) will calibrate the VCO. When CALSELECT = '1' , toggling the PLLRESET bit (Register 2 bit 20) will calibrate the VCO. Default value = '0' 14 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 15 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 16 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 17 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 18 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 19 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 20 PLLRESET Diagnostics When CALSELECT='1' this bit forces a VCO calibration when toggled "1-0-1". If CALSELECT='0' this bit is ignored. RAM 21 TITSTCFG0 Diagnostics TI Test Registers. For TI Use Only RAM 22 TITSTCFG1 Diagnostics TI Test Registers. For TI Use Only RAM 23 TITSTCFG2 Diagnostics TI Test Registers. For TI Use Only RAM 24 TITSTCFG3 Diagnostics TI Test Registers. For TI Use Only RAM 25 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 26 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM 27 RESERVED Diagnostics TI Test Registers. For TI Use Only RAM Submit Documentation Feedback RAM Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Device Control Figure 20 provides a conceptual explanation of the CDCE62002 Device operation. Table 10 defines how the device behaves in each of the operational states. Power Applied Power ON Reset Device OFF Delay Finished PLLRESET= ON Power Down = OFF PLLRESET= ON CAL Done Power Down = ON VCO CAL Sync = ON Power Down Power Down = ON Active Mode Sync Sync = OFF Figure 20. CDCE62002 Device State Control Diagram Table 10. CDCE62002 Device State Definitions SPI Port Status PLL Status Output Divider Status Output Buffer Status Power On Reset and EEPROM loading delays are finished OR the PD pin is set LOW. OFF Disabled Disabled OFF Delay process in the Power-On Reset State is finished or PLLRESET=ON Calibration Process in completed ON Enabled Disabled OFF Normal Operation CAL Done (VCO calibration process finished) or Sync = OFF (from Sync State). Power Down or PLLRESET=ON ON Enabled Disabled or Enabled Disabled or Enabled Power Down Used to shut down all hardware and Resets the device after exiting the Power Down State. Therefore, the EEPROM contents will eventually be copied into RAM after the Power Down State is exited. PD pin is pulled LOW. PD pin is pulled HIGH. ON Disabled Disabled Disabled Sync Sync synchronizes both outputs dividers so that they begin counting at the same time Sync Bit in device register 2 bit 8 is set LOW Sync bit in device register 2 bit 8 is set HIGH ON Enabled Disabled Disabled State Device Behavior Entered Via Exited Via Power-On Reset After device power supply reaches approximately 2.35V, the contents of EEPROM are copied into the Device Registers, thereby initializing the device hardware . Power applied to the device or upon exit from Power Down State via the PD pin set HIGH. VCO CAL The voltage controlled oscillator is calibrated based on the PLL settings and the incoming reference clock. After the VCO has been calibrated, the device enters Active Mode automatically. Active Mode Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 23 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com External Control Pins Power Down (PD) When pulled LOW, PD activates the Power Down state which shuts down all hardware and resets the device. Restoring PD high will cause the CDCE62002 to exit the Power Down State. This causes the device to behave as if it has been powered up including copying the EEPROM contents into RAM. PD pin also has a shadowed PD bit residing in Register 2 Bit 7. When asserted Low it puts the device in Power Down Mode, but it does not load the EEPROM when the bits is disserted. NOTE The SPI_LE signal has to be high in order for the EEPROM to load correctly into RAM on the Rising edge of PD Pin. FACTORY DEFAULT PROGRAMMING The CDCE62002 is factory pre-programmed to work with 25 MHz input from the reference input or from the auxiliary input with auto switching enabled. An internal PFD of 6.25 MHz and about 400 KHz loop bandwidth. Output 0 is pre-programmed as an LVPECL driver to output 156.25 MHz and output 1 is pre-programmed as LVDS driver to output 125 MHz. 25 MHz U0P 25Mhz (LVPECL AC coupled) AUTO U0N XTAL 25 MHz 25Mhz U1P CDCE62002 Default Programing EEPROM Register 0 Register 1 U1N LVPECL 156.25 MHz 156.25Mhz LVDS 125 MHz 125Mhz Register Content 72A000E0 8389A061 Figure 21. CDCE62002 Default Factory Programming 24 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com INPUT BLOCK The Input Block includes one Universal Input Buffers, an Auxiliary Input, and a Smart Multiplexer. Register 0 2 3 Smart MUX Control Register 0 1 0 Smart Multiplexer Universal Input Buffers LVPECL : 500 MHz LVDS: 500 MHz LVCMOS : 250 MHz Pre-Divider /1 or /2 REF_IN 9 Auxiliary Input 8 7 6 Register 0 XTAL / AUX_IN Crystal : 2 MHz - 42 MHz Smart MUX Reference Divider /1 - /8 Figure 22. CDCE62002 Input Block With References to Registers The CDCE62002 provides a Reference Divider that divides the clock exiting Reference (REF_IN) input buffer. Table 11. CDCE62002 Reference Divider Settings REFERENCE DIVIDER BIT NAME REGISTER BIT TOTAL DIVIDE RATIO REFDIVIDE3 REFDIVIDE2 REFDIVIDE1 REFDIVIDE0 0.9 0.8 0.7 0.6 0 0 0 0 /1 0 0 0 1 /2 0 0 1 0 /3 0 0 1 1 /4 0 1 0 0 /5 0 1 0 1 /6 0 1 1 0 /7 0 1 1 1 /8 1 0 0 0 /2 1 0 0 1 /4 1 0 1 0 /6 1 0 1 1 /8 1 1 0 0 /10 1 1 0 1 /12 1 1 1 0 /14 1 1 1 1 /16 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 25 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Reference Input Buffer Figure 23 shows the key elements of a Universal Input Buffer (UIB). A UIB supports multiple formats along with different termination and coupling schemes. The CDCE62002 implements the UIB by including on board switched termination, a programmable bias voltage generator, and a multiplexer. The CDCE62002 provides a high degree of configurability on the UIB to facilitate most existing clock input formats. REF_IN only provides biasing internally. It is recommended to terminate externally if needed. REF_IN Universal Input Control Register 0 PN 5k TERMSEL INBUFSELY INBUFSELX ACDCSEL P N VBB 0 1.9V 1 0 1 1.2V ON ON 0 0 1.2V 0 1 1 1.2V 1 1 X --OFF OFF 1 X X X --- 1 0 PP Register 0 5k 0 Vbb 1 4 5 Input buffer Mode LVPECL - AC coupled note (1) LVDS - AC coupled LVDS - DC coupled LVCMOS Input Buffer Termination Disabled note (1): This setting is not recommended. Vbb 1uF Figure 23. CDCE62002 Universal Input Buffer Smart Multiplexer Dividers Register 0 2 3 Setting REFSEL AUXSEL Smart MUX Control Register 0 0 1 Smart Multiplexer REF_IN Pre-Divider /1 or /2 9 Reference Divider /1 - /8 8 7 Smart MUX 0.2 0 1 0.3 0 0 0 1 1 1 Smart Mux Mode Reserved REF Select AUX Select Auto Select 6 Register 0 XTAL / AUX_IN Figure 24. CDCE62002 Smart Multiplexer In Auto Select Mode the Smart Mux switches automatically between Reference input and Auxiliary input with a preference to the Reference input. In order for the Smart Mux to function correctly the frequency after the reference divider and the Auxiliary Input signal frequency should be within 20% of each other or one of them should be zero or ground. In REF Select mode, it is recommended to connect AUX_IN to GND with a 1k pull-down resistor. In AUX Select mode it is recommended to pull REF_INp high and REF_INn low with a 1k resistor each. 26 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Auxiliary Input Port The auxiliary input on the CDCE62002 is designed to connect to an AT-Cut Crystal with a total load capacitance of 8 pF to 10pF. One side of the crystal connects to Ground while the other side connects to the Auxiliary input of the device. The circuit accepts crystals from 2 to 42 MHz. See the Crystal Input Interface section for crystal load selection. Figure 25. CDCE62002 Auxiliary Input Port Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 27 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com OUTPUT BLOCK The output block includes two identical output channels. Each output channel comprises of a clock divider module, and a universal output buffer as shown in Figure 26. OUTPUT 0 Sync Pulse OUTPUT 1 Registers 0 Registers 0 15 16 17 18 19 20 21 22 Output Buffer Control Enable UxP SYNTH Clock Divider Module 0 LVDS UxN LVPECL Clock Divider Module 1 Figure 26. CDCE62002 Output Channel Table 12. CDCE62002 Output Divider Settings OUTPUT DIVIDERS SETTING 28 DIVIDER 0 0.18 0.17 0.16 0.15 DIVIDER 1 0.22 0.21 0.20 0.19 0 0 0 0 Disabled 0 0 0 1 /1 0 0 1 0 /2 0 0 1 1 /3 0 1 0 0 /4 0 1 0 1 /5 0 1 1 0 /6 0 1 1 1 Disabled 1 0 0 0 /8 1 0 0 1 Disabled 1 0 1 0 /10 1 0 1 1 /20 1 1 0 0 /12 1 1 0 1 /24 1 1 1 0 /16 1 1 1 1 /32 Submit Documentation Feedback DIVIDE RATIO Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com SYNTHESIZER BLOCK Figure 27 provides an overview of the CDCE62002 synthesizer block. The Synthesizer Block provides a Phase Locked Loop, a partially integrated programmable loop filter, and two Voltage Controlled Oscillators (VCO). The synthesizer block generates an output clock called "SYNTH" and drives it onto the Internal Clock Distribution Bus. Loop Filter and Charge Pump Current Settings Input Divider Settings Register 1 8 7 6 5 4 3 2 Register 1 25 24 23 22 1 Prescaler Register 1 9 SMART _MUX 8 1.75 GHz - 2.356 GHz Input Divider /1 - /256 PFD/ CP Feedback Divider Prescaler /2,/3,/4,/5 SYNTH /1,/2,/5,/8,/10,/16,/20 /8 - /1280 Register 1 0 VCO Select Register 1 Register 1 18 17 16 15 14 13 12 11 Feedback Divider 21 20 19 Feedback Bypass Divider Figure 27. CDCE62002 Synthesizer Block Input Divider The Input Divider divides the clock signal selected by the Smart Multiplexer and presents the divided signal to the Phase Frequency Detector / Charge Pump of the frequency synthesizer. Table 13. CDCE62002 Input Divider Settings INPUT DIVIDER SETTINGS DIVIDE RATIO SELINDIV7 SELINDIV6 SELINDIV5 SELINDIV4 SELINDIV3 SELINDIV2 SELINDIV1 SELINDIV0 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 0 0 0 0 0 0 0 0 1 0 0 0 0 0 0 0 1 2 0 0 0 0 0 0 1 0 3 0 0 0 0 0 0 1 1 4 0 0 0 0 0 1 0 0 5 0 0 0 0 0 1 0 1 6 - - - - - - - - - - - - - - - - - - 1 1 1 1 1 1 1 1 256 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 29 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Feedback and Feedback Bypass Divider Table 14 shows how to configure the Feedback divider for various divide values: Table 14. CDCE62002 Feedback Divider Settings FEEDBACK DIVIDER DIVIDE RATIO SELFBDIV7 SELFBDIV6 SELFBDIV5 SELFBDIV4 SELFBDIV3 SELFBDIV2 SELFBDIV1 SELFBDIV0 1.18 1.17 1.16 1.15 1.14 1.13 1.12 1.11 0 0 0 0 0 0 0 0 8 0 0 0 0 0 0 0 1 12 0 0 0 0 0 0 1 0 16 0 0 0 0 0 0 1 1 20 0 0 0 0 0 1 0 1 24 0 0 0 0 0 1 1 0 32 0 0 0 0 1 0 0 1 36 0 0 0 0 0 1 1 1 40 0 0 0 0 1 0 1 0 48 0 0 0 1 1 0 0 0 56 0 0 0 0 1 0 1 1 60 0 0 0 0 1 1 1 0 64 0 0 0 1 0 1 0 1 72 0 0 0 0 1 1 1 1 80 0 0 0 1 1 0 0 1 84 0 0 0 1 0 1 1 0 96 0 0 0 1 0 0 1 1 100 0 1 0 0 1 0 0 1 108 0 0 0 1 1 0 1 0 112 0 0 0 1 0 1 1 1 120 0 0 0 1 1 1 1 0 128 0 0 0 1 1 0 1 1 140 0 0 1 1 0 1 0 1 144 0 0 0 1 1 1 1 1 160 0 0 1 1 1 0 0 1 168 0 1 0 0 1 0 1 1 180 0 0 1 1 0 1 1 0 192 0 0 1 1 0 0 1 1 200 0 1 0 1 0 1 0 1 216 0 0 1 1 1 0 1 0 224 0 0 1 1 0 1 1 1 240 0 1 0 1 1 0 0 1 252 0 0 1 1 1 1 1 0 256 0 0 1 1 1 0 1 1 280 0 1 0 1 0 1 1 0 288 0 1 0 1 0 0 1 1 300 0 0 1 1 1 1 1 1 320 0 1 0 1 1 0 1 0 336 0 1 0 1 0 1 1 1 360 0 1 0 1 1 1 1 0 384 1 1 0 1 1 0 0 0 392 0 1 1 1 0 0 1 1 400 30 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 14. CDCE62002 Feedback Divider Settings (continued) FEEDBACK DIVIDER DIVIDE RATIO SELFBDIV7 SELFBDIV6 SELFBDIV5 SELFBDIV4 SELFBDIV3 SELFBDIV2 SELFBDIV1 SELFBDIV0 1.18 1.17 1.16 1.15 1.14 1.13 1.12 1.11 0 1 0 1 1 0 1 1 420 1 0 1 1 0 1 0 1 432 0 1 1 1 1 0 1 0 448 0 1 0 1 1 1 1 1 480 1 0 0 1 0 0 1 1 500 1 0 1 1 1 0 0 1 504 0 1 1 1 1 1 1 0 512 0 1 1 1 1 0 1 1 560 1 0 1 1 0 1 1 0 576 1 1 0 1 1 0 0 1 588 1 0 0 1 0 1 1 1 600 0 1 1 1 1 1 1 1 640 1 0 1 1 1 0 1 0 672 1 0 0 1 1 0 1 1 700 1 0 1 1 0 1 1 1 720 1 0 1 1 1 1 1 0 768 1 1 0 1 1 0 1 0 784 1 0 0 1 1 1 1 1 800 1 0 1 1 1 0 1 1 840 1 1 0 1 1 1 1 0 896 1 0 1 1 1 1 1 1 960 1 1 0 1 1 0 1 1 980 1 1 1 1 1 1 1 0 1024 1 1 0 1 1 1 1 1 1120 1 1 1 1 1 1 1 1 1280 Table 15 shows how to configure the Feedback Bypass Divider. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 31 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 15. CDCE62002 Feedback Bypass Divider Settings FEEDBACK BYPASS DIVIDER SELBPDIV2 SELBPDIV1 SELBPDIV0 DIVIDE RATIO 1.21 1.20 1.19 0 0 0 2 0 0 1 5 0 1 0 8 0 1 1 10 1 0 0 16 1 0 1 20 1 1 0 RESERVED 1 1 1 1(bypass) VCO Select Table 16 illustrates how to control the dual voltage controlled oscillators. Table 16. CDCE62002 VCO Select BIT NAME VCO SELECT SELVCO REGISTER NAME VCO CHARACTERISTICS 1.0 VCO RANGE Fmin (MHz) Fmax (MHz) 0 Low 1750 2046 1 High 2040 2356 Prescaler Table 17 shows how to configure the prescaler. Table 17. CDCE62002 Prescaler Settings SETTINGS 32 SELPRESCB SELPRESCA 1.10 1.9 DIVIDE RATIO 0 0 5 1 0 4 0 1 3 1 1 2 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Loop Filter Figure 28 depicts the loop filter topology of the CDCE62002. It facilitates both internal and external implementations providing optimal flexibility. EXT_LFP EXT_LFN Registers 0 internal external internal external 25 24 23 22 VB + PFD/ CP R3 C3 C1 C2 R2 Figure 28. CDCE62002 Loop Filter Topology Internal Loop Filter Component Configuration Figure 28 illustrates the switching between four fixed internal loop filter settings and the external loop filter setting. Table 18 shows that the CDCE62002 has 16 settings different settings for the loop filter. Four of the settings are internal and twelve are external. Table 18. CDCE62002 Loop Filter Settings Charge Pump LFRCSEL 3 2 1 0 Loop Filter C1 C2 R2 R3 C3 Current 0 0 0 0 Internal 1.5 pF 473.5 pF 4.0k 5k 2.5 pF 1.5 mA 0 0 0 1 Internal 1.5 pF 473.5 pF 4.0k 5k 2.5 pF 400 A 0 0 1 0 Internal 1.5 pF 473.5 pF 2.7k 5k 2.5 pF 250 A 0 0 1 1 Internal 1.5 pF 473.5 pF 2.7k 5k 2.5 pF 150 A 0 1 0 0 External X X X 20k 112 pF 1.0 mA 0 1 0 1 External X X X 20k 112 pF 2.0 mA 0 1 1 0 External X X X 20k 112 pF 3.0 mA 0 1 1 1 External X X X 20k 112 pF 3.75 mA 1 0 0 0 External X X X 10k 100 pF 1.0 mA 1 0 0 1 External X X X 10k 100 pF 2.0 mA 1 0 1 0 External X X X 10k 100 pF 3.0 mA 1 0 1 1 External X X X 10k 100 pF 3.75 mA 1 1 0 0 External X X X 5k 100 pF 1.0 mA 1 1 0 1 External X X X 5k 64 pF 2.0 mA 1 1 1 0 External X X X 5k 48 pF 3.0 mA 1 1 1 1 External X X X 5k 38 pF 3.75 mA Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 33 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Lock Detect The CDCE62002 provides a lock detect indicator circuit that can be detected on an external Pin PLL_LOCK (Pin 32) and internally by reading PLLLOCKPIN bit (6) in Register 2. Two signals whose phase difference is less than a prescribed amount are `locked' otherwise they are `unlocked'. The phase frequency detector / charge pump compares the clock provided by the input divider and the feedback divider; using the input divider as the phase reference. The lock detect circuit implements a programmable lock detect window. Table 19 shows an overview of how to configure the lock detect feature. The PLL_LOCK pin will possibly jitter several times between lock and out of lock until the PLL achieves a stable lock. If desired, choosing a wide loop bandwidth and a high number of successive clock cycles virtually eliminates this characteristic. PLL_LOCK will return to out of lock, if just one cycle is outside the lock detect window or if a cycle slip occurs. Lock Detect Window (Max) From Input Divider Locked From Feedback Divider Unlocked From Input Divider From Feedback Divider From Input Divider PFD/ CP From Lock Detector Lock Detect Window Adjust To Loop Filter PLL_LOCK Register 0 From Feedback Divider 1 = Locked O = Unlocked 13 14 (b) (a) (c) Figure 29. CDCE62002 Lock Detect Table 19. CDCE62002 Lock Detect Control LOCK DETECT BIT NAME REGISTER NAME LOCK DETECT WINDOW LOCKW(1) LOCKW(0) 0.13 0.14 0 0 2.1 ns 0 1 4.6 ns 1 0 7.2 ns 1 1 19.9 ns VCO Calibration The CDCE62002 includes two on-chip LC oscillator-based VCOs with low phase noise covering a frequency range of 1.75 GHz to 2.356 GHz. The VCO must be calibrated to ensure proper operation over the valid device operating conditions. VCO calibration is controlled by the reference clock input. This calibration requires that the PLL be set up properly to lock the PLL loop and that the reference clock input be present. The device enters self-calibration of the VCO automatically at power up, after the registers have been loaded from the EEPROM and an input clock signal is detected. If there is no input clock available during power up, the VCO will wait for reference clock before starting calibration. If the input signal is not valid during self-calibration, it is necessary to re-initiate VCO calibration after the input clock signal stabilizes. IMPORTANT NOTE: Re-calibration is also necessary anytime a PLL setting is changed (e.g. divider ratios in the PLL or loop filter settings are adjusted). VCO calibration can be initiated by writing to register 2 bits 7, 13 and 20. 34 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Table 20. VCO Calibration Method Through Register Programming CALSELECT Reg 2.13 PLLRESET 2.20 PD 2.7 1 1-0-1 1 0 X 1-0-1 (1) VCO CALIBRATION MECHANISM (1) VCO calibration starts at PLLRESET toggling low-to-high. The outputs turn off for the duration of the calibration, which is a few ns. Device is powered down when PD is toggle 1-to-0. All outputs are disabled while PD is zero. After asserting PD from zero to one the VCO becomes calibrated and immediately afterwards the device outputs turn on. A VCO calibration is also initiated if the external PD pin is toggle high-low-high. In this case all EEPROM registers become reloaded into the device and the CALSELECT bit is reset to 0. Crystal Input Interface Fundamental mode is the recommended oscillation mode of operation for the input crystal and parallel resonance is the recommended type of circuit for the crystal. A crystal load capacitance refers to all capacitances in the oscillator feedback loop. It is equal to the amount of capacitance seen between the terminals of the crystal in the circuit. For parallel resonant mode circuits, the correct load capacitance is necessary to ensure the oscillation of the crystal within the expected parameters. The CDCE62002 implements an input crystal oscillator circuitry, known as the Colpitts oscillator, and requires one pad of the crystal to interface with the AUX_IN pin; the other pad of the crystal is tied to ground. In this crystal interface, it is important to account for all sources of capacitance when calculating the correct value for the discrete capacitor component, CL, for a design. The CDCE62002 has been characterized with 10-pF parallel resonant crystals. The input crystal oscillator stage in the CDCE62002 is designed to oscillate at the correct frequency for all parallel resonant crystals with low-pull capability and rated with a load capacitance that is equal to the sum of the on-chip load capacitance at the AUX_IN pin (10-pF), crystal stray capacitance, and board parasitic capacitance between the crystal and AUX_IN pin. The normalized frequency error of the crystal, as a result of load capacitance mismatch, can be calculated as Equation 4: CS CS Df = f 2 CL,R + C O 2 C L,A + C O ( ) ( ) (4) Where: CS is the motional capacitance of the crystal C0 is the shunt capacitance of the crystal CL,R is the rated load capacitance for the crystal CL,A is the actual load capacitance in the implemented PCB for the crystal f is the frequency error of the crystal f is the rated frequency of the crystal The first three parameters can be obtained from the crystal vendor. To minimize the frequency error of the crystal to meet application requirements, the difference between the rated load capacitance and the actual load capacitance should be minimized and a crystal with low-pull capability (low CS) should be used. For example, if an application requires less than 50 ppm frequency error and a crystal with less than 50 ppm frequency tolerance is picked, the characteristics are as follows: C0 = 7 pF, CS = 10 pF, and CL,R = 12 pF. To meet the required frequency error, calculate CL,A using Equation 4 to be 17 pF. Subtracting CL,R from CL,A, results in 5 pF; care must be taken during printed circuit board (PCB) layout with the crystal and the CDCE62002 to ensure that the sum of the crystal stray capacitance and board parasitic capacitance is less than the calculated 5 pF. Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 35 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Good layout practices are fundamental to the correct operation and reliability of the oscillator. It is critical to locate the crystal components very close to the XIN pin to minimize routing distances. Long traces in the oscillator circuit are a very common source of problems. Do not route other signals across the oscillator circuit. Also, make sure power and high-frequency traces are routed as far away as possible to avoid crosstalk and noise coupling. Avoid the use of vias; if the routing becomes very complex, it is better to use 0- resistors as bridges to go over other signals. Vias in the oscillator circuit should only be used for connections to the ground plane. Do not share ground connections; instead, make a separate connection to ground for each component that requires grounding. If possible, place multiple vias in parallel for each connection to the ground plane. Especially in the Colpitts oscillator configuration, the oscillator is very sensitive to capacitance in parallel with the crystal. Therefore, the layout must be designed to minimize stray capacitance across the crystal to less than 5 pF total under all circumstances to ensure proper crystal oscillation. Be sure to take into account both PCB and crystal stray capacitance. Start-up Time Estimation The CDCE62002 startup time can be estimated based on the parameters defined in Table 21 and graphically shown in Figure 30. Table 21. Start-up Time Dependencies PARAMETER DEFINITION DESCRIPTION METHOD OF DETERMINATION tpul Power-supply rise time to low limit of Power On Power-up time (low limit) Reset (POR) trip point Time required for power supply to ramp to 2.27 V tpuh Power-up time (high limit) Power-supply rise time to high limit of Power On Reset (POR) trip point Time required for power supply to ramp to 2.64 V trsu Reference start-up time After POR releases, the Colpitts oscillator is 500 s best-case and 800 s worst-case enabled. This start-up time is required for the (This is only for crystal connected to oscillator to generate the requisite signal levels for AUX_IN) the delay block to be clocked by the reference input tdelay Delay time Internal delay time generated from the clock. This delay provides time for the oscillator to stabilize. tVCO_CAL VCO calibration time VCO calibration time generated from the PFD clock. t VCO_CAL = 550 x tPFD This process selects the operating point for the t PFD = period of the PFD clock VCO based on the PLL settings. tPLL_LOCK PLL lock time Time required for PLL to lock within 10 ppm of reference frequency tdelay = 16384 x tid tid = period of input clock to the input divider tPLL_LOCK = 3/LBW LBW = PLL Loop Bandwidth Figure 30. Start-up Time dependencies 36 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Device Power Calculation and Thermal Management The CDCE62002 is a high performance device; therefore careful attention must be paid to device configuration and printed circuit board layout with respect to power consumption. Table 22 provides the power consumption for the individual blocks within the CDCE62002. To estimate total power consumption, calculate the sum of the products of the number of blocks used and the power dissipated of each corresponding block. Table 22. CDCE62002 Power Consumption INTERNAL BLOCK (Power at 3.3V) POWER DISSIPATED PER BLOCK (mW) NUMBER OF BLOCKS PER DEVICE Input Circuit 32 1 PLL and VCO Core 333 1 Output Divider 92 2 Output Buffer ( LVPECL) 150 2 Output Buffer (LVDS) 95 2 Output Buffer (LVCMOS) 62 4 This power estimate determines the degree of thermal management required for a specific design. Observing good thermal layout practices enables the thermal pad on the backside of the QFN-32 package to provide a good thermal path between the die contained within the package and the ambient air. This thermal pad also serves as the ground connection the device; therefore, a low inductance connection to the ground plane is essential. Back Side Component Side QFN-32 Thermal Slug (package bottom) Solder Mask Internal Ground Plane Internal Power Plane Thermal Dissipation Pad (back side) Thermal Vias No Solder Mask Figure 31. CDCE62002 Recommended PCB Layout CDCE62002 Power Supply Bypassing - Recommended Layout Figure 32 shows a conceptual layout focusing on power supply bypass capacitor placement. If the capacitors are mounted on the back side, 0402 components can be employed; however, soldering to the Thermal Dissipation Pad can be difficult. If the capacitors are mounted on the component side, 0201 components must be used to facilitate signal routing. In either case, the connections between the capacitor and the power supply terminal on the device must be kept as short as possible. Component & Back Side Component Side Only Figure 32. CDCE62002 Power Supply Bypassing Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 37 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com APPLICATION INFORMATION AND GENERAL USAGE HINTS Clock Generator The CDCE62002 can generate 1 to 4 low noise clocks from a single crystal or crystal oscillator as follows: Feedback Divider XTAL / AUX_IN Smart MUX PFD/ CP Input Divider Prescaler U0P Output Divider 0 U0N U1P Output Divider 1 U1N Figure 33. CDCE62002 as a Clock Generator SERDES Startup and Clock Cleaner The CDCE62002 can serve as a SERDES device companion by providing a crystal based reference for the SERDES device to lock to receive data stream and when the SERDES locks to the data and outputs the recovered clock the CDCE62002 can switch and use the recovered clock and serve as a jitter cleaner. Data SERDES Cleaned Clock Recovered Clock EXT_LFP REF_IN EXT _LFN Reference Divider Output Divider 0 XTAL /AUX_IN Input Divider Feedback Divider PFD/ CP Prescaler Output Divider 1 U0P U0N U1P U1N Figure 34. CDCE62002 Clocking SERDES Since the jitter of the recovered clock can be above 100 ps (RMS) the output jitter from CDCE62002 can be as low and 6 ps (RMS) depending on the external loop filter configuration. 38 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com CLOCKING ADCS WITH THE CDCE62002 High-speed analog to digital converters incorporate high input bandwidth on both the analog port and the sample clock port. Often the input bandwidth far exceeds the sample rate of the converter. Engineers regularly implement receiver chains that take advantage of the characteristics of bandpass sampling. This implementation trend often causes engineers working in communications system design to encounter the term "clock limited performance". Therefore, it is important to understand the impact of clock jitter on ADC performance. The following equation shows the relationship of data converter signal to noise ratio (SNR) to total jitter: e u 1 SNR jitter = 20log10 e u e 2p fin jittertotal u (5) Total jitter comprises two components: the intrinsic aperture jitter of the converter and the jitter of the sample clock: jittertotal = (jitterADC )2 + (jitterCLK )2 (6) With respect to an ADC with N-bits of resolution, ignoring total jitter, ADC quantization error, and input noise, the following equation shows the relationship between resolution and SNR: S N R A D C = 6.02N + 1.76 (7) Figure 35 plots Equation 5 and Equation 7 for constant values of total jitter. When used in conjunction with most ADCs, the CDCE62002 supports a total jitter performance value of <1ps. 140 130 120 110 100 90 80 70 60 50 40 30 20 10 0 26 24 22 20 100 fs 18 16 1ps 50 fs 14 12 350 fs 10 8 Resolution (bits) SNR (dB) Data Converter Jitter Requirements 6 4 2 1 10 100 0 10000 1000 Input Bandwidth (MHz) Figure 35. Data Converter Jitter Requirements Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 39 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com REVISION HISTORY NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Original (June, 2009) to Revision A Page * Added NOTE: All VCC pins need to be connected for the device to operate properly. ....................................................... 3 * Added information to Pin 18 description - The input has an internal 150-k pull-up resist ................................................. 4 * Changed graphic input naming ............................................................................................................................................. 5 * Changed graphic input naming ............................................................................................................................................. 6 * Changed PLVPECL, PLVDS, PLVCMOS and POFF Unit values From: W To: mW .......................................................................... 9 * Deleted underscore before IN+ ............................................................................................................................................. 9 * Deleted 6 from 8006 ........................................................................................................................................................... 12 * Changed Y4 to Y1 .............................................................................................................................................................. 13 * Added tr / tf MIN, TYP, and MAX values ............................................................................................................................. 13 * Added (Reg 0 RAM bit 9 = 0) to fREF - Diff REF_DIV ................................................................................................................. 15 * Changed REF into REF_IN ................................................................................................................................................ 15 * Changed part number error ................................................................................................................................................ 17 * Changed REFERENCE to REF_IN and AUXILARY to AUX_IN, Table 6 .......................................................................... 20 * Changed power to current .................................................................................................................................................. 20 * Changed the description of bits 0 - 5 To: TI Test Registers. For TI Use Only in Table 9 .................................................. 22 * Changed graphic ................................................................................................................................................................. 23 * Changed Table 10 .............................................................................................................................................................. 23 * Changed PDDRESET to PLLRESET, in Table 10 ............................................................................................................. 23 * Changed Power_Down to PD, in Table 10 ......................................................................................................................... 23 * Changed PRI_IN to REF_IN in Figure 22 ........................................................................................................................... 25 * Changed PRI_IN to REF_IN ............................................................................................................................................... 26 * Changed PRI_IN to REF_IN ............................................................................................................................................... 38 Changes from Revision A (July, 2009) to Revision B Page * Deleted feature reference to "Single Ended Clock Source or Crystal." and "LVCMOS Input of up to 75MHz" ................... 1 * Deleted references to single ended inputs and CMOS clock from description. ................................................................... 2 * Changed the description of Pin 2, AUX_IN .......................................................................................................................... 4 * Deleted references to EEPROM Locking from "Interface and Control Block" section ......................................................... 6 * Deleted "LVCMOS INPUT MODE (AUX_IN)" section from Electrical Characteristic ........................................................... 9 * Changed Crystal Shunt Capacitance to Crystal Load Capacitance with a MIN value of 8 .................................................. 9 * Deleted "LVCMOS INPUT MODE (AUX_IN)" section from Electrical Characteristic ......................................................... 10 * Deleted fREF - Single paramter from AUXILARY_IN_REQUIRMENTS ................................................................................... 15 * Changed EXTFEEDBACK to RESERVED for bit 10 in Table 6 ......................................................................................... 20 * Changed EELOCK to RESERVED for bit 30 in Table 8 ..................................................................................................... 21 * Changed Auxiliary Input Port section .................................................................................................................................. 27 * Deleted External Feed Back Mode section ........................................................................................................................ 27 * Deleted External Feedback Option section ........................................................................................................................ 38 40 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 CDCE62002 SCAS882D - JUNE 2009 - REVISED FEBRUARY 2012 www.ti.com Changes from Revision B (February 2010) to Revision C Page * Changed Pin Functions table, Pins 9, 12 to VCC_OUT0. Pins 13 and 16 to VCC_OUT1 .................................................. 3 * Changed pin 31 From: Power To: A. Power in Pin Functions table ..................................................................................... 3 * Changed Pin 7 to open drain in Pin Functions table ............................................................................................................ 3 * Changed Note1 of the Pin Functions table ........................................................................................................................... 3 * Changed the description of Pin 30, REF_IN-. ...................................................................................................................... 4 * Changed the description of Pin 19, TESTSYNC To: Reserved Pin.....resistor. ................................................................... 4 * Deleted Dividers and from ELEC CHARACTERISTICS table in row POFF ........................................................................... 9 * Changed Crytal input section first row From: Crystal Load Capacitance To: On-chip Load Capacitance ........................... 9 * Added SPI OUTPUT row From: PLL To: PLL_LOCK ......................................................................................................... 10 * Changed tr / tf Max value From: 735 To: 135 ...................................................................................................................... 13 * Deleted (Reg 0 RAM bit 9 = 1) and (Reg 0 RAM bit 9 = 0) from the TIMING REQUIREMENTS table ............................. 15 * Added Driver Level and Max shunt capacitance to AUXILARY_IN REQUIREMENT in the TIMING REQUIREMENTS table .................................................................................................................................................................................... 15 * Deleted Columns from Table 2: LVDS-HP and LVCMOS-HP ............................................................................................ 15 * Changed Table 3 ................................................................................................................................................................ 15 * Changed the OUTPUT TO OUTPUT ISOLATION section ................................................................................................. 16 * Deleted the SPI CONTROL INTERFACE TIMING section ................................................................................................ 16 * Changed figure Figure 12 ................................................................................................................................................... 16 * Changed the INTERFACE AND CONTROL BLOCK section ............................................................................................. 17 * Changed Table 7, RAM BITS To REGISTER BITS ........................................................................................................... 21 * Deleted the First four rows in Table 8 and the first column ................................................................................................ 21 * Deleted (6 settings+DisAble+Enable) in Register bit 19 of Table 8 ................................................................................... 21 * Added ; set '0' to TI use Only in bit 26 in Table 8 ............................................................................................................... 21 * Changed the description of bit 27 in Table 8 ...................................................................................................................... 21 * Deleted the First four rows in Table 9 and the first column ................................................................................................ 22 * Changed Figure 21 ............................................................................................................................................................. 24 * Changed the Reference Input Buffer section ..................................................................................................................... 26 * Changed Figure 23 ............................................................................................................................................................. 26 * Changed the Smart Multiplexer Dividers section ................................................................................................................ 26 * Changed Changed the text in the Smart Multiplexer Divider section ................................................................................. 26 * Changed Figure 27 ............................................................................................................................................................. 29 * Deleted column "3 db Corner C3R3" from Table 18 .......................................................................................................... 33 * Added sections: VCO Calibration, Crystal Input Interface, and Startup Time .................................................................... 34 * Changed Figure 34 ............................................................................................................................................................. 38 Changes from Revision C (March 2011) to Revision D Page * Added a sentence below Equation 3 .................................................................................................................................... 8 * Added 3 rows in TIMING REQUIREMENTS table, under Duty Cycle row ......................................................................... 15 * Added a reference to Table 11 and 2 references to Table 12 in Table 6 ........................................................................... 20 * Added 6 crossreferences to Table 8 ................................................................................................................................... 21 * Changed changed last row in Table 8 Description column, from "always reads 1" to "May read back to 1 or 0" ............. 21 * Changed last row last column in Figure 23 truth table from "Disabled" to "Input Buffer Termination Disabled" ................ 26 * Changed in Table 13, second column, 5th and 6th row from 1 to 0 .................................................................................. 29 Submit Documentation Feedback Copyright (c) 2009-2012, Texas Instruments Incorporated Product Folder Link(s): CDCE62002 41 PACKAGE OPTION ADDENDUM www.ti.com 27-Jul-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (C) Device Marking (3) (4/5) CDCE62002RHBR ACTIVE VQFN RHB 32 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 CDCE 62002 CDCE62002RHBT ACTIVE VQFN RHB 32 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 CDCE 62002 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. 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Addendum-Page 1 Samples PACKAGE MATERIALS INFORMATION www.ti.com 27-Jul-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant CDCE62002RHBR VQFN RHB 32 3000 330.0 12.4 5.3 5.3 1.5 8.0 12.0 Q2 CDCE62002RHBT VQFN RHB 32 250 180.0 12.4 5.3 5.3 1.5 8.0 12.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 27-Jul-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) CDCE62002RHBR VQFN RHB 32 3000 338.1 338.1 20.6 CDCE62002RHBT VQFN RHB 32 250 210.0 185.0 35.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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