LM25101
PWM
Controller
VIN
T1
RGATE
CBOOT
0.1µF
1.0µF
VDD
VCC
OUT1
OUT2
VDD
HI
LI
VSS
HS
LO
HO
HB
Optional external
fast recovery diode
RBOOT
RGATE
DBOOT
Anti-Parallel Diode
(Optional)
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Design
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LM25101
SNVS859C JULY 2012REVISED SEPTEMBER 2016
LM25101 3-A, 2-A, and 1-A 80-V Half-Bridge Gate Drivers
1
1 Features
1 Independent High and Low Driver Logic Inputs
Bootstrap Supply Voltage up to 100-V DC
Drives Both a High-Side and Low-Side N-Channel
MOSFETs
Fast Propagation Times (25 ns Typical)
Drives 1000-pF Load With 8-ns Rise and Fall
Times
Excellent Propagation Delay Matching (3 ns
Typical)
Supply Rail Undervoltage Lockout
Low Power Consumption
Pin Compatible With HIP2100 and HIP2101
2 Applications
Motor-Controlled Drivers
Half and Full Bridge Power Converters
Synchronous Buck Converters
Two Switch Forward Power Converters
Forward With Active Clamp Converters
48-V Server Power
Solar DC-DC and DC-AC Converters
3 Description
The LM25101 high-voltage gate driver is designed to
drive both the high-side and the low-side N-Channel
MOSFETs in a synchronous buck or a half-bridge
configuration. The A version provides a full 3-A of
gate drive while the B and C versions provide 2-A
and 1-A, respectively. The outputs are independently
controlled with TTL input thresholds. An integrated
high voltage diode is provided to charge the high-side
gate drive bootstrap capacitor. A robust level shifter
operates at high speed while consuming low power
and providing clean level transitions from the control
logic to the high-side gate driver. Undervoltage
lockout is provided on both the low-side and the high-
side power rails.
These devices are available in the standard 8-pin
SOIC, 8-pin SO-PowerPAD, 8-pin WSON, 10-pin
WSON, and 8-pin MSOP PowerPAD packages.
Device Information(1)
PART NUMBER PACKAGE BODY SIZE (NOM)
LM25101
MSOP PowerPAD (8) 3 mm × 3 mm
WSON (8) 4 mm × 4 mm
WSON (10) 4 mm × 4 mm
SO PowerPAD (8) 3.9 mm × 4.89 mm
SOIC (8) 3.91 mm × 4.9 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Simplified Application Diagram
2
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Table of Contents
1 Features.................................................................. 1
2 Applications ........................................................... 1
3 Description............................................................. 1
4 Revision History..................................................... 2
5 Device Options....................................................... 3
6 Pin Configuration and Functions......................... 3
7 Specifications......................................................... 4
7.1 Absolute Maximum Ratings ...................................... 4
7.2 ESD Ratings.............................................................. 5
7.3 Recommended Operating Conditions....................... 5
7.4 Thermal Information.................................................. 5
7.5 Electrical Characteristics........................................... 6
7.6 Switching Characteristics.......................................... 7
7.7 Typical Characteristics.............................................. 8
8 Detailed Description............................................ 12
8.1 Overview................................................................. 12
8.2 Functional Block Diagram....................................... 12
8.3 Feature Description................................................. 12
8.4 Device Functional Modes........................................ 13
9 Application and Implementation ........................ 14
9.1 Application Information............................................ 14
9.2 Typical Application.................................................. 14
10 Power Supply Recommendations ..................... 16
11 Layout................................................................... 17
11.1 Layout Guidelines ................................................. 17
11.2 Layout Example .................................................... 18
12 Device and Documentation Support................. 19
12.1 Receiving Notification of Documentation Updates 19
12.2 Community Resources.......................................... 19
12.3 Trademarks........................................................... 19
12.4 Electrostatic Discharge Caution............................ 19
12.5 Glossary................................................................ 19
13 Mechanical, Packaging, and Orderable
Information........................................................... 19
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (March 2013) to Revision C Page
Added ESD Ratings table, Feature Description section, Device Functional Modes,Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section.................................................................................................. 1
Added Thermal Information table........................................................................................................................................... 5
Changes from Original (March 2013) to Revision A Page
Changed layout of National Semiconductor Data Sheet to TI format .................................................................................... 1
1VDD 10 LO
2HB 9 VSS
3HO 8 LI
4HS 7 HI
5NC 6 NC
Not to scale
Thermal Pad
1VDD 8 LO
2HB 7 VSS
3HO 6 LI
4HS 5 HI
Not to scale
Thermal Pad
1VDD 8 LO
2HB 7 VSS
3HO 6 LI
4HS 5 HI
Not to scale
1VDD 8 LO
2HB 7 VSS
3HO 6 LI
4HS 5 HI
Not to scale
PowerPAD
3
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5 Device Options
Table 1. Input/Output Options
Part Number Input Thresholds Peak Output Current
LM25101A TTL 3 A
LM25101B TTL 2 A
LM25101C TTL 1 A
6 Pin Configuration and Functions
DGN and DDA Packages
8-Pin MSOP and SO PowerPAD
Top View
NGT Package
8-Pin WSON
Top View
D Package
8-Pin SOIC
Top View
DPR Package
10-Pin WSON
Top View
4
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(1) TI recommends that the exposed thermal pad on the bottom of the applicable packages is soldered to ground plane of the PCB, and the
ground plane should extend out from beneath the IC to help dissipate heat.
Pin Functions
PIN TYPE DESCRIPTION
NAME MSOP
PowerPAD WSON
(8) WSON
(10) SO
PowerPAD SOIC
HB 2 2 2 2 2 PWR High-side gate driver bootstrap rail. Connect the positive
terminal of the bootstrap capacitor to HB and the
negative terminal to HS. The bootstrap capacitor should
be placed as close to the IC as possible.
HI 5 5 7 5 5 I High-side driver control input. The LM25101 inputs have
TTL type thresholds. Unused inputs should be tied to
ground and not left open.
HO 3 3 3 3 3 O High-side gate driver output. Connect to the gate of
high-side MOSFET with a short, low inductance path.
HS 4 4 4 4 4 GND High-side MOSFET source connection. Connect to the
bootstrap capacitor negative terminal and the source of
the high-side MOSFET.
LI 6 6 8 6 6 I Low-side driver control input. The LM25101 inputs have
TTL type thresholds. Unused inputs should be tied to
ground and not left open.
LO 8 8 10 8 8 O Low-side gate driver output. Connect to the gate of the
low-side MOSFET with a short, low inductance path.
NC 5, 6 No connection
VDD 1 1 1 1 1 PWR Positive gate drive supply. Locally decouple to VSS
using a low ESR and ESL capacitor located as close to
the IC as possible.
VSS 7 7 9 7 7 GND Ground return. All signals are referenced to this ground.
Thermal
Pad PowerPAD Thermal
Pad Thermal
Pad PowerPAD Solder to the ground plane under the IC to aid in heat
dissipation.(1)
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. For
performance limits and associated test conditions, see the Electrical Characteristics tables.
(2) In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS node will generally not
exceed –1 V. However, in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage
transiently. If negative transients occur, the HS voltage must never be more negative than VDD 15 V. For example, if VDD = 10 V, the
negative transients at HS must not exceed –5 V.
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
VDD to VSS 0.3 18 V
HB to HS 0.3 18 V
LI or HI Input 0.3 VDD + 0.3 V
LO Output 0.3 VDD + 0.3 V
HO Output VHS - 0.3 VHB + 0.3 V
HS to VSS(2) –5 100 V
HB to VSS 100 V
Junction temperature, TJ150 °C
Storage temperature, Tstg –55 150 °C
5
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(1) The Human Body Model (HBM) is a 100-pF capacitor discharged through a 1.5-kresistor into each pin.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.2 ESD Ratings VALUE UNIT
V(ESD) Electrostatic discharge
Human-body model (HBM), per
ANSI/ESDA/JEDEC JS-001(1) All pins except 2, 3, and 4 ±2000
V
Pins 2, 3, and 4 ±1000
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) ±250
Machine model (MM) ±100
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT
VDD Supply voltage VDD 9 14 V
VHS Voltage HS –1 100 VDD V
VHB Voltage HB VHS + 8 VHS + 14 V
HS slew rate 50 V/ns
TJJunction temperature –40 125 °C
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
7.4 Thermal Information
THERMAL METRIC(1)
LM25101A, LM25101B LM25101C
UNITD (SOIC) DDA (SO
PowerPAD) NGT
(WSON) DPR
(WSON) D (SOIC) DPR
(WSON) DGN (MSOP
PowerPAD)
8 PINS 8 PINS 8 PINS 10 PINS 8 PINS 10 PINS 8 PINS
RθJA Junction-to-ambient thermal
resistance 108.2 46.1 38.2 37.8 111.5 39.8 54.1 °C/W
RθJC(top) Junction-to-case (top) thermal
resistance 50.6 53.5 36.3 35.8 54.2 39.1 55.9 °C/W
RθJB Junction-to-board thermal resistance 49.1 13.8 15.2 15.0 52.3 17.1 15.1 °C/W
ψJT Junction-to-top characterization
parameter 7.6 4.2 0.3 0.3 9.0 0.4 2.4 °C/W
ψJB Junction-to-board characterization
parameter 48.5 13.9 15.4 15.3 51.7 17.3 15.1 °C/W
RθJC(bot) Junction-to-case (bottom) thermal
resistance 3.9 4.5 4.4 6.1 4.6 °C/W
6
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(1) Minimum and maximum limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through
correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
7.5 Electrical Characteristics
Typical values apply for TJ= 25°C only. Minimum and maximum limits apply for TJ= –40°C to 125°C.(1) Unless otherwise
specified, VDD = VHB = 12 V, VSS = VHS = 0 V, No Load on LO or HO.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SUPPLY CURRENTS
IDD VDD quiescent current VLI = VHI = 0 V 0.25 0.4 mA
IDDO VDD operating current f = 500 kHz 2.0 3 mA
IHB Total HB quiescent current VLI = VHI = 0 V 0.06 0.2 mA
IHBO Total HB operating current f = 500 kHz 1.6 3 mA
IHBS HB to VSS current (quiescent) VHS = VHB = 100 V 0.1 10 µA
IHBSO HB to VSS current (operating) f = 500 kHz 0.4 mA
INPUT PINS
VIL Input voltage threshold Rising Edge 1.3 1.8 2.3 V
VIHYS Input voltage hysteresis 50 mV
RIInput pulldown resistance 100 200 400 k
UNDER VOLTAGE PROTECTION
VDDR VDD rising threshold 6.0 6.9 7.4 V
VDDH VDD threshold hysteresis 0.5 V
VHBR HB rising threshold 5.7 6.6 7.1 V
VHBH HB threshold hysteresis 0.4 V
BOOT STRAP DIODE
VDL Low-current forward voltage IVDD-HB = 100 µA 0.52 0.85 V
VDH High-current forward voltage IVDD-HB = 100 mA 0.8 1 V
RD Dynamic resistance IVDD-HB = 100 mA 1.0 1.65
LO AND HO GATE DRIVER
VOL Low-level output voltage IHO = ILO = 100 mA A version 0.12 0.25 VB version 0.16 0.4
C version 0.28 0.65
VOH High-level output voltage IHO = ILO = 100 mA
VOH = VDD VLO or
VOH = VHB VHO
A version 0.24 0.45 VB version 0.28 0.60
C version 0.60 1.10
IOHL Peak pullup current HO, VLO = 0 V A version 3 AB version 2
C version 1
IOLL Peak pulldown current HO, VLO = 12 V A version 3 AB version 2
C version 1
7
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(1) Minimum and maximum limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through
correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL).
7.6 Switching Characteristics
Typical values apply for TJ= 25°C only. Minimum and maximum limits apply for TJ= –40°C to 125°C.(1) Unless otherwise
specified, VDD = VHB = 12 V, VSS = VHS = 0 V, No Load on LO or HO.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
tLPHL LO turnoff propagation delay LI falling to LO falling 22 56 ns
tLPLH LO turnon propagation delay LI rising to LO rising 26 56 ns
tHPHL HO turnoff propagation delay HI falling to HO falling 22 56 ns
tHPLH LO turnon propagation delay HI rising to HO rising 26 56 ns
tMON Delay matching LO ON and HO OFF 4 10 ns
tMOFF Delay matching LO OFF and HO ON 4 10 ns
tRC, tFC Either output rise and fall time CL= 1000 pF 8 ns
tROutput rise time (3 V to 9 V) CL= 0.1 µF A version 430 nsB version 570
C version 990
tFOutput fall time (3 V to 9 V) CL= 0.1 µF A version 260 nsB version 430
C version 715
tPW Minimum input pulse duration that changes
the output 50 ns
tBS Bootstrap diode reverse recovery time IF= 100 mA, IR= 100 mA 37 ns
Figure 1. Timing Diagram
0.1 1 10 100 1000
FREQUENCY (kHz)
100
1000
10000
100000
CURRENT (PA)
VDD = 12V CL = 4400 pF
CL = 1000 pF
CL = 0 pF
-50 -25 0 25 50 75 100 125 150
TEMPERATURE (oC)
0.7
0.9
1.1
1.3
1.5
1.7
1.9
2.1
2.3
CURRENT (mA)
IDDO
IHBO
02 4 68 10 12
OUTPUT VOLTAGE (V)
0.0
3.5
CURRENT (A)
0.5
1.0
1.5
2.0
2.5
3.0
LM25101B
LM25101C
LM25101A
VDD = 12V
02 4 68 10 12
OUTPUT VOLTAGE (V)
0.0
3.5
CURRENT (A)
0.5
1.0
1.5
2.0
2.5
3.0
LM25101B
LM25101C
LM25101A
VDD = 12V
7 8 9 10 11 12 13 14 15
CURRENT (A)
VDD (V)
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
LM25101B
LM25101C
LM25101A
7 8 9 10 11 12 13 14 15
CURRENT (A)
VDD (V)
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
LM25101B
LM25101C
LM25101A
8
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7.7 Typical Characteristics
Figure 2. Peak Sourcing Current vs Supply Voltage Figure 3. Peak Sinking Current vs Supply Voltage
Figure 4. Sink Current vs Output Voltage Figure 5. Source Current vs Output Voltage
Figure 6. IDD vs Frequency Figure 7. Operating Current vs Temperature
-25 0 25 50 75 100 125 150
TEMPERATURE (oC)
0.30
0.35
0.40
0.45
0.50
0.55
0.60
HYSTERESIS (V)
-50
VHBH
VDDH
1.00E-06
1.00E-05
1.00E-04
1.00E-03
1.00E-02
1.00E-01
ID (A)
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
VD (V)
T = 25°C
T = -40°C
T = 150°C
-50 -25 0 25 50 75 100 125 150
TEMPERATURE (°C)
CURRENT (PA)
IDD
IHB
0
50
100
150
200
250
300
350
-50 -25 0 25 50 75 100 125 150
TEMPERATURE (°C)
6.30
6.40
6.50
6.60
6.70
6.80
6.90
7.00
7.10
7.20
7.30
THRESHOLD (V)
VHBR
VDDR
0.1 1 10 100 1000
FREQUENCY (kHz)
10
100
1000
10000
100000
CURRENT (PA)
HB = 12V,
HS = 0V
CL = 0 pF
CL = 4400 pF
CL = 1000 pF
8 9 10 11 12 13 14 15 16
VDD, VHB (V)
0
50
100
150
200
250
300
350
400
CURRENT (PA)
IDD
IHB
9
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Typical Characteristics (continued)
Figure 8. IHB vs Frequency Figure 9. Quiescent Current vs Supply Voltage
Figure 10. Quiescent Current vs Temperature Figure 11. Undervoltage Rising Thresholds
vs Temperature
Figure 12. Undervoltage Threshold Hysteresis
vs Temperature Figure 13. Bootstrap Diode Forward Voltage
78 9 10 11 12 13 14
VDD (V)
15
0.1
0.8
VOH (V)
0.2
0.3
0.4
0.5
0.6
0.7
LM25101B
LM25101C
LM25101A
IOUT = -100 mA
-50 -25 0 25 50 75 100 125 150
VOL (V)
TEMPERATURE (°C)
0.00
0.50
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
0.45
LM25101B
LM25101C
LM25101A
VDD = 12V
T_PLH
T_PHL
-50 -25 0 25 50 75 100 125 150
TEMPERATURE (°C)
15
25
30
35
40
DELAY (ns)
20
-50 -25 0 25 50 75 100 125 150
VOH (V)
TEMPERATURE (°C)
0.0
1.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
LM25101B
LM25101C
LM25101A
VDD = 12V
THRESHOLD VOLTAGE (V)
-50 -25 0 25 50 75 100 125 150
TEMPERATURE (°C)
1.80
1.81
1.82
1.83
1.84
1.85
1.86
1.87
1.88
1.89
1.90
1.91
1.92
Rising
Falling
THRESHOLD VOLTAGE (V)
8 9 10 11 12 13 14 15 16
VDD (V)
1.80
1.81
1.82
1.83
1.84
1.85
1.86
1.87
1.88
1.89
1.90
1.91
1.92
Rising
Falling
10
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Typical Characteristics (continued)
Figure 14. Input Threshold vs Temperature Figure 15. Input Threshold vs Supply Voltage
Figure 16. Propagation Delay vs Temperature Figure 17. LO and HO Gate Drive:
High Level Output Voltage vs Temperature
Figure 18. LO and HO Gate Drive:
Low Level Output Voltage vs Temperature Figure 19. LO and HO Gate Drive:
Output High Voltage vs Supply Voltage
78 9 10 11 12 13 14 15
VDD (V)
VOL (V)
0.10
0.15
0.35
0.20
0.25
0.30
LM25101B
LM25101A
IOUT = 100 mA
LM25101C
11
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Typical Characteristics (continued)
Figure 20. LO and HO Gate Drive:
Output Low Voltage vs Supply Voltage
LO
UVLO
HO
DRIVER
UVLO LEVEL
SHIFT
HB
HS
DRIVER
VDD
VSS
HI
LI
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8 Detailed Description
8.1 Overview
To operate fast switching of power MOSFETs at high switching frequencies and to reduce associated switching
losses, a powerful gate driver is employed between the PWM output of controller and the gates of the power
semiconductor devices. Also, gate drivers are indispensable when it is impossible for the PWM controller to
directly drive the gates of the switching devices. With the advent of digital power, this situation is often
encountered because the PWM signal from the digital controller is often a 3.3 V logic signal which cannot
effectively turn on a power switch. Level shift circuitry is needed to boost the 3.3-V signal to the gate-drive
voltage (such as 12 V) in order to fully turn on the power device and minimize conduction losses. Traditional
buffer drive circuits based on NPN or PNP bipolar transistors in totem-pole arrangement prove inadequate with
digital power because they lack level-shifting capability. Gate drivers effectively combine both the level-shifting
and buffer-drive functions. Gate drivers also find other needs such as minimizing the effect of high-frequency
switching noise (by placing the high-current driver IC physically close to the power switch), driving gate-drive
transformers and controlling floating power-device gates, reducing power dissipation and thermal stress in
controllers by moving gate charge power losses from the controller into the driver.
8.2 Functional Block Diagram
8.3 Feature Description
8.3.1 Start-Up and UVLO
Both top and bottom drivers include UVLO protection circuitry which monitors the supply voltage (VDD) and
bootstrap capacitor voltage (VHB-HS) independently. The UVLO circuit inhibits each output until sufficient supply
voltage is available to turn on the external MOSFETs, and the built-in UVLO hysteresis prevents chattering
during supply voltage variations. When the supply voltage is applied to the VDD pin of the LM25101, the top and
bottom gates are held low until VDD exceeds the UVLO threshold, typically about 6.9 V. Any UVLO condition on
the bootstrap capacitor (VHB-HS) will only disable the high-side output (HO).
13
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(1) VHB-HS > VHBR
Table 2. VDD UVLO Feature Logic Operation
CONDITION(1) HI LI HO LO
VDD VSS < VDDR during device start-up H L L L
VDD VSS < VDDR during device start-up L H L L
VDD VSS < VDDR during device start-up H H L L
VDD VSS < VDDR during device start-up L L L L
VDD VSS < VDDR VDDH after device start-up H L L L
VDD VSS < VDDR VDDH after device start-up L H L L
VDD VSS < VDDR VDDH after device start-up H H L L
VDD VSS < VDDR VDDH after device start-up L L L L
(1) VDD>VDDR
Table 3. VHB-HS UVLO Feature Logic Operation
CONDITION(1) HI LI HO LO
VHBHS < VHBR during device start-up H L L L
VHB–HS < VHBR during device start-up L H L H
VHB–HS < VHBR during device start-up H H L H
VHB–HS < VHBR during device start-up L L L L
VHB–HS < VHBR VHBH after device start-up H L L L
VHB–HS < VHBR VHBH after device start-up L H L H
VHB–HS < VHBR VHBH after device start-up H H L H
VHB–HS < VHBR VHBH after device start-up L L L L
8.3.2 Level Shift
The level shift circuit is the interface from the high-side input to the high-side driver stage which is referenced to
the switch node (HS). The level shift allows control of the HO output which is referenced to the HS pin and
provides excellent delay matching with the low-side driver.
8.3.3 Output Stages
The output stages are the interface to the power MOSFETs in the power train. High slew rate, low resistance,
and high peak current capability of both outputs allow for efficient switching of the power MOSFETs. The low-
side output stage is referenced to VSS and the high-side is referenced to HS.
8.4 Device Functional Modes
The device operates in normal mode and UVLO mode. See Start-Up and UVLO for more information on UVLO
operation mode. In normal mode when the VDD and VHB–HS are above UVLO threshold, the output stage is
dependent on the states of the HI and LI pins. Unused inputs should be tied to ground and not left open.
(1) HO is measured with respect to the HS pin.
(2) LO is measured with respect to the VSS pin.
Table 4. INPUT and OUTPUT Logic Table
HI LI HO(1) LO(2)
LLLL
L H L H
H L H L
HHHH
LM25101
PWM
Controller
VIN
T1
RGATE
CBOOT
0.1µF
1.0µF
VDD
VCC
OUT1
OUT2
VDD
HI
LI
VSS
HS
LO
HO
HB
Optional external
fast recovery diode
RBOOT
RGATE
DBOOT
Anti-Parallel Diode
(Optional)
Copyright © 2016, Texas Instruments Incorporated
14
LM25101
SNVS859C JULY 2012REVISED SEPTEMBER 2016
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Product Folder Links: LM25101
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9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
The LM25101 is a high voltage gate driver designed to drive both the high-side and low-side N-Channel
MOSFETs in a half or full bridge configuration or in a synchronous buck circuit. The floating high side driver is
capable of operating with supply voltages up to 100 V. This allows for N-Channel MOSFETs control in half-
bridge, full-bridge, push-pull, two switch forward, and active clamp topologies. The outputs are independently
controlled. Each channel is controlled by its respective input pins (HI and LI), allowing full and independent
flexibility to control the state (ON and OFF) of the output.
9.2 Typical Application
Figure 21. Application Diagram
9.2.1 Design Requirements
For this design example, use the parameters listed in Table 5 as the input parameters.
Table 5. Design Parameters
PARAMETER EXAMPLE VALUE
Gate driver LM25101 (C version)
MOSFET CSD19534KCS
VDD 10 V
QG17 nC
fSW 500 kHz
DD
OLL LOL Gate FET_Int
V
IR R R
DD
OHL LOH Gate GFET_Int
V
IR R R
DD DH
OLH HOL Gate GFET_Int
V V
IR R R
DD DH
OHH Gate GFET_IHOH nt
V V 10V 1.0V
I 0.5A
R R R 1.1V /100mA 4.7 2.2
|
: :
15
LM25101
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(1) This value is either provided directly by the data sheet or is estimated from the testing conditions using RHOH = VOHH / IHO.
9.2.2 Detailed Design Procedure
9.2.2.1 Selecting External Gate Driver Resistor
External gate driver resistor (RGATE) is sized to reduce ringing caused by parasitic inductances and capacitances
and also to limit the current coming out of the gate driver.
Peak HO pullup current is calculated using Equation 1.
where
IOHHis the peak pullup current
VDHis the bootstrap diode forward voltage drop
RHOHis the gate driver internal HO pullup resistance (1)
RGateis the external gate drive resistance
R(GFET_Int) is the MOSFET internal gate resistance, provided by the transistor data sheet (1)
Similarly, Peak HO pulldown current is calculated using Equation 2.
where
RHOL is the HO pulldown resistance (2)
Peak LO pullup current is calculated using Equation 3.
where
RLOH is the LO pullup resistance (3)
Peak LO pulldown current is calculated using Equation 4.
where
RLOL is the LO pulldown resistance (4)
If the application requires fast turnoff, an anti-paralleled diode on RGate may be used to bypass the external gate
drive resistor and speed up the turnoff transition.
16
LM25101
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9.2.3 Application Curves
Figure 22 and Figure 23 show the rising and falling time and turnon and turnoff propagation delay testing
waveform at room temperature. Each channel (HI, LI, HO, LO) is labeled and displayed on the left hand of the
waveform.
The HI and LI pins are shorted together for these test waveforms. Therefore, the propagation delay matching
between the channels can be measured and inspected.
CL= 1 nF VDD = 12 V fSW = 500 kHz
Figure 22. Rising Time and Turnon Propagation Delay
CL= 1 nF VDD = 12 V fSW = 500 kHz
Figure 23. Falling Time and Turnoff Propagation Delay
10 Power Supply Recommendations
The total IC power dissipation is the sum of the gate driver losses and the bootstrap diode losses. The gate
driver losses are related to the switching frequency (f), output load capacitance on LO and HO (CL), and supply
voltage (VDD), which can be roughly calculated using Equation 5.
PDGATES = 2 × f × CL× VDD2(5)
There are some additional losses in the gate drivers due to the internal CMOS stages used to buffer the LO and
HO outputs. Figure 24 shows the measured gate driver power dissipation versus frequency and load
capacitance. At higher frequencies and load capacitance values, the power dissipation is dominated by the
power losses driving the output loads and agrees well with Equation 5.Figure 24 can be used to approximate the
power losses due to the gate drivers.
The bootstrap diode power loss is the sum of the forward bias power loss that occurs while charging the
bootstrap capacitor and the reverse bias power loss that occurs during reverse recovery. Since each of these
events happens once per cycle, the diode power loss is proportional to frequency. Larger capacitive loads
require more energy to recharge the bootstrap capacitor resulting in more losses. Higher input voltages (VIN) to
the half bridge result in higher reverse recovery losses. Figure 25 was generated based on calculations and lab
measurements of the diode recovery time and current under several operating conditions and can be used to
approximate the diode power dissipation.
The total IC power dissipation can be estimated from these plots by summing the gate drive losses with the
bootstrap diode losses for the intended application.
0.1 1.0 10.0 100.0 1000.0
SWITCHING FREQUENCY (kHz)
0.001
0.010
0.100
1.000
POWER (W)
CL = 4400 pF
CL = 0 pF
CL = 1000 pF
110 100 1000
SWITCHING FREQUENCY (kHz)
POWER (W)
0.001
0.010
0.100
CL = 4400 pF
CL = 0 pF
17
LM25101
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VDD = 12 V Neglecting Diode Losses
Figure 24. Gate Driver Power Dissipation (LO + HO)
VIN = 50 V
Figure 25. Diode Power Dissipation
11 Layout
11.1 Layout Guidelines
The optimum performance of high and low-side gate drivers cannot be achieved without following certain
guidelines during circuit-board layout.
Low ESR and ESL capacitors must be connected close to the IC, between the VDD and VSS pins and
between the HB and HS pins to support the high peak currents being drawn from VDD during start-up of the
external MOSFET.
To prevent large voltage transients at the drain of the top MOSFET, a low ESR electrolytic capacitor must be
connected between the MOSFET drain and ground (VSS).
To avoid large negative transients on the switch node (HS pin), the parasitic inductances must be minimized
in the source of the top MOSFET and in the drain of the bottom MOSFET (synchronous rectifier).
Grounding Considerations:
The first priority in designing grounding connections is to confine to a minimal physical area the high peak
currents that charge and discharge the MOSFET gate. This decreases the loop inductance and minimizes
noise issues on the gate terminal of the MOSFET. The MOSFETs should be placed as close as possible
to the gate driver.
The second high current path includes the bootstrap capacitor, the bootstrap diode, the local ground
referenced bypass capacitor, and low-side MOSFET body diode. The bootstrap capacitor is recharged on
a cycle-by-cycle basis through the bootstrap diode from the ground referenced VDD bypass capacitor. The
recharging occurs in a short time interval and involves high peak current. Minimizing this loop length and
area on the circuit board is important to ensure reliable operation.
Figure 26 shows a recommended layout pattern for the driver. If possible a single layer placement is preferred.
To Hi-Side FET To Low-Side FET
HO
Single Layer
Option
LO
GND
Multi Layer
Option
Recommended Layout for Driver IC and
Passives
VSS
LO
LI
SO
PowerPAD
HI
VDD
HB
HO
HS
HO
HS
18
LM25101
SNVS859C JULY 2012REVISED SEPTEMBER 2016
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Product Folder Links: LM25101
Submit Documentation Feedback Copyright © 2012–2016, Texas Instruments Incorporated
11.2 Layout Example
Figure 26. Recommended Layout Pattern
19
LM25101
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Submit Documentation FeedbackCopyright © 2012–2016, Texas Instruments Incorporated
12 Device and Documentation Support
12.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.5 Glossary
SLYZ022 TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
LM25101AM/NOPB ACTIVE SOIC D 8 95 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
AM
LM25101AMR/NOPB ACTIVE SO PowerPAD DDA 8 95 RoHS & Green SN Level-3-260C-168 HR -40 to 125 L25101
AMR
LM25101AMRX/NOPB ACTIVE SO PowerPAD DDA 8 2500 RoHS & Green SN Level-3-260C-168 HR -40 to 125 L25101
AMR
LM25101AMX/NOPB ACTIVE SOIC D 8 2500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
AM
LM25101ASD-1/NOPB ACTIVE WSON NGT 8 1000 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101A1
LM25101ASD/NOPB ACTIVE WSON DPR 10 1000 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101A
LM25101ASDX-1/NOPB ACTIVE WSON NGT 8 4500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101A1
LM25101ASDX/NOPB ACTIVE WSON DPR 10 4500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101A
LM25101BMA/NOPB ACTIVE SOIC D 8 95 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
BMA
LM25101BMAX/NOPB ACTIVE SOIC D 8 2500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
BMA
LM25101BSD/NOPB ACTIVE WSON DPR 10 1000 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101B
LM25101BSDX/NOPB ACTIVE WSON DPR 10 4500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101B
LM25101CMA/NOPB ACTIVE SOIC D 8 95 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
CMA
LM25101CMAX/NOPB ACTIVE SOIC D 8 2500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 L25101
CMA
LM25101CMY/NOPB ACTIVE HVSSOP DGN 8 1000 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 CMYN
LM25101CMYE/NOPB ACTIVE HVSSOP DGN 8 250 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 CMYN
LM25101CMYX/NOPB ACTIVE HVSSOP DGN 8 3500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 CMYN
LM25101CSD/NOPB ACTIVE WSON DPR 10 1000 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101C
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
Addendum-Page 2
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead finish/
Ball material
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
LM25101CSDX/NOPB ACTIVE WSON DPR 10 4500 RoHS & Green SN Level-1-260C-UNLIM -40 to 125 25101C
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
LM25101AMRX/NOPB SO
Power
PAD
DDA 8 2500 330.0 12.4 6.5 5.4 2.0 8.0 12.0 Q1
LM25101AMX/NOPB SOIC D 8 2500 330.0 12.4 6.5 5.4 2.0 8.0 12.0 Q1
LM25101ASD-1/NOPB WSON NGT 8 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101ASD/NOPB WSON DPR 10 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101ASDX-1/NOPB WSON NGT 8 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101ASDX/NOPB WSON DPR 10 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101BMAX/NOPB SOIC D 8 2500 330.0 12.4 6.5 5.4 2.0 8.0 12.0 Q1
LM25101BSD/NOPB WSON DPR 10 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101BSDX/NOPB WSON DPR 10 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101CMAX/NOPB SOIC D 8 2500 330.0 12.4 6.5 5.4 2.0 8.0 12.0 Q1
LM25101CMY/NOPB HVSSOP DGN 8 1000 178.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
LM25101CMYE/NOPB HVSSOP DGN 8 250 178.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
LM25101CMYX/NOPB HVSSOP DGN 8 3500 330.0 12.4 5.3 3.4 1.4 8.0 12.0 Q1
LM25101CSD/NOPB WSON DPR 10 1000 178.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
LM25101CSDX/NOPB WSON DPR 10 4500 330.0 12.4 4.3 4.3 1.3 8.0 12.0 Q1
PACKAGE MATERIALS INFORMATION
www.ti.com 6-Sep-2019
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
LM25101AMRX/NOPB SO PowerPAD DDA 8 2500 367.0 367.0 35.0
LM25101AMX/NOPB SOIC D 8 2500 367.0 367.0 35.0
LM25101ASD-1/NOPB WSON NGT 8 1000 210.0 185.0 35.0
LM25101ASD/NOPB WSON DPR 10 1000 210.0 185.0 35.0
LM25101ASDX-1/NOPB WSON NGT 8 4500 367.0 367.0 35.0
LM25101ASDX/NOPB WSON DPR 10 4500 367.0 367.0 35.0
LM25101BMAX/NOPB SOIC D 8 2500 367.0 367.0 35.0
LM25101BSD/NOPB WSON DPR 10 1000 210.0 185.0 35.0
LM25101BSDX/NOPB WSON DPR 10 4500 367.0 367.0 35.0
LM25101CMAX/NOPB SOIC D 8 2500 367.0 367.0 35.0
LM25101CMY/NOPB HVSSOP DGN 8 1000 210.0 185.0 35.0
LM25101CMYE/NOPB HVSSOP DGN 8 250 210.0 185.0 35.0
LM25101CMYX/NOPB HVSSOP DGN 8 3500 367.0 367.0 35.0
LM25101CSD/NOPB WSON DPR 10 1000 210.0 185.0 35.0
LM25101CSDX/NOPB WSON DPR 10 4500 367.0 367.0 35.0
PACKAGE MATERIALS INFORMATION
www.ti.com 6-Sep-2019
Pack Materials-Page 2
www.ti.com
PACKAGE OUTLINE
C
6X 0.65
2X
1.95
8X 0.38
0.25
5.05
4.75 TYP
SEATING
PLANE
0.15
0.05
0.25
GAGE PLANE
0 -8
1.1 MAX
0.23
0.13
1.88
1.58
2.0
1.7
B3.1
2.9
NOTE 4
A
3.1
2.9
NOTE 3
0.7
0.4
PowerPAD VSSOP - 1.1 mm max heightDGN0008A
SMALL OUTLINE PACKAGE
4218836/A 11/2019
1
4
5
8
0.13 C A B
PIN 1 INDEX AREA
SEE DETAIL A
0.1 C
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-187.
PowerPAD is a trademark of Texas Instruments.
TM
A 20
DETAIL A
TYPICAL
SCALE 4.000
EXPOSED THERMAL PAD
1
45
8
9
www.ti.com
EXAMPLE BOARD LAYOUT
0.05 MAX
ALL AROUND 0.05 MIN
ALL AROUND
8X (1.4)
8X (0.45)
6X (0.65)
(4.4)
(R0.05) TYP
(2)
NOTE 9
(3)
NOTE 9
(1.22)
(0.55)
( 0.2) TYP
VIA
(1.88)
(2)
PowerPAD VSSOP - 1.1 mm max heightDGN0008A
SMALL OUTLINE PACKAGE
4218836/A 11/2019
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
8. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
9. Size of metal pad may vary due to creepage requirement.
TM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE: 15X
SYMM
SYMM
1
45
8
SOLDER MASK
DEFINED PAD
METAL COVERED
BY SOLDER MASK
SEE DETAILS
9
15.000
METAL
SOLDER MASK
OPENING METAL UNDER
SOLDER MASK SOLDER MASK
OPENING
EXPOSED METAL
EXPOSED METAL
SOLDER MASK DETAILS
NON-SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK
DEFINED
www.ti.com
EXAMPLE STENCIL DESIGN
8X (1.4)
8X (0.45)
6X (0.65)
(4.4)
(R0.05) TYP
(1.88)
BASED ON
0.125 THICK
STENCIL
(2)
BASED ON
0.125 THICK
STENCIL
PowerPAD VSSOP - 1.1 mm max heightDGN0008A
SMALL OUTLINE PACKAGE
4218836/A 11/2019
1.59 X 1.690.175 1.72 X 1.830.15 1.88 X 2.00 (SHOWN)0.125 2.10 X 2.240.1
SOLDER STENCIL
OPENING
STENCIL
THICKNESS
NOTES: (continued)
10. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
11. Board assembly site may have different recommendations for stencil design.
TM
SOLDER PASTE EXAMPLE
EXPOSED PAD 9:
100% PRINTED SOLDER COVERAGE BY AREA
SCALE: 15X
SYMM
SYMM
1
45
8
METAL COVERED
BY SOLDER MASK SEE TABLE FOR
DIFFERENT OPENINGS
FOR OTHER STENCIL
THICKNESSES
www.ti.com
PACKAGE OUTLINE
C
6X 1.27
8X 0.51
0.31
2X
3.81
TYP
0.25
0.10
0 - 8 0.15
0.00
2.71
2.11
3.4
2.8 0.25
GAGE PLANE
1.27
0.40
4214849/A 08/2016
PowerPAD SOIC - 1.7 mm max heightDDA0008B
PLASTIC SMALL OUTLINE
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MS-012.
PowerPAD is a trademark of Texas Instruments.
TM
18
0.25 C A B
5
4
PIN 1 ID
AREA
NOTE 4
SEATING PLANE
0.1 C
SEE DETAIL A
DETAIL A
TYPICAL
SCALE 2.400
EXPOSED
THERMAL PAD
4
1
5
8
9
TYP
6.2
5.8
1.7 MAX
A
NOTE 3
5.0
4.8
B4.0
3.8
www.ti.com
EXAMPLE BOARD LAYOUT
(5.4)
(1.3) TYP
( ) TYP
VIA
0.2
(R ) TYP0.05
0.07 MAX
ALL AROUND 0.07 MIN
ALL AROUND
8X (1.55)
8X (0.6)
6X (1.27)
(2.95)
NOTE 9
(4.9)
NOTE 9
(2.71)
(3.4)
SOLDER MASK
OPENING
(1.3)
TYP
4214849/A 08/2016
PowerPAD SOIC - 1.7 mm max heightDDA0008B
PLASTIC SMALL OUTLINE
SYMM
SYMM
SEE DETAILS
LAND PATTERN EXAMPLE
SCALE:10X
1
45
8
SOLDER MASK
OPENING
METAL COVERED
BY SOLDER MASK
SOLDER MASK
DEFINED PAD
9
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
8. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
numbers SLMA002 (www.ti.com/lit/slma002) and SLMA004 (www.ti.com/lit/slma004).
9. Size of metal pad may vary due to creepage requirement.
10. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
TM
METAL
SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
PADS 1-8
OPENING
SOLDER MASK METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
www.ti.com
EXAMPLE STENCIL DESIGN
(R ) TYP0.05
8X (1.55)
8X (0.6)
6X (1.27)
(5.4)
(2.71)
(3.4)
BASED ON
0.125 THICK
STENCIL
4214849/A 08/2016
PowerPAD SOIC - 1.7 mm max heightDDA0008B
PLASTIC SMALL OUTLINE
2.29 X 2.870.175 2.47 X 3.100.150 2.71 X 3.40 (SHOWN)0.125 3.03 X 3.800.1
SOLDER STENCIL
OPENING
STENCIL
THICKNESS
NOTES: (continued)
11. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
12. Board assembly site may have different recommendations for stencil design.
TM
SOLDER PASTE EXAMPLE
EXPOSED PAD
100% PRINTED SOLDER COVERAGE BY AREA
SCALE:10X
SYMM
SYMM
1
45
8
BASED ON
0.125 THICK
STENCIL
BY SOLDER MASK
METAL COVERED SEE TABLE FOR
DIFFERENT OPENINGS
FOR OTHER STENCIL
THICKNESSES
9
www.ti.com
PACKAGE OUTLINE
C
8X 0.35
0.25
3 0.05
2X
2.4
2.6 0.05
6X 0.8
0.8 MAX
0.05
0.00
8X 0.5
0.3
A4.1
3.9 B
4.1
3.9
(0.2) TYP
WSON - 0.8 mm max heightNGT0008A
PLASTIC SMALL OUTLINE - NO LEAD
4214935/A 08/2020
PIN 1 INDEX AREA
SEATING PLANE
0.08 C
1
45
8
PIN 1 ID 0.1 C A B
0.05 C
THERMAL PAD
EXPOSED
SYMM
SYMM
9
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
SCALE 3.000
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MIN
ALL AROUND
0.07 MAX
ALL AROUND
8X (0.3)
(3)
(3.8)
6X (0.8)
(2.6)
( 0.2) VIA
TYP (1.05)
(1.25)
8X (0.6)
(R0.05) TYP
WSON - 0.8 mm max heightNGT0008A
PLASTIC SMALL OUTLINE - NO LEAD
4214935/A 08/2020
SYMM
1
45
8
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
SYMM 9
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
SOLDER MASK
OPENING
SOLDER MASK
METAL UNDER
SOLDER MASK
DEFINED
EXPOSED
METAL
METAL
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NON SOLDER MASK
DEFINED
(PREFERRED)
EXPOSED
METAL
www.ti.com
EXAMPLE STENCIL DESIGN
(R0.05) TYP
(1.31)
(0.675)
8X (0.3)
8X (0.6)
(1.15)
(3.8)
(0.755)
6X (0.8)
WSON - 0.8 mm max heightNGT0008A
PLASTIC SMALL OUTLINE - NO LEAD
4214935/A 08/2020
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD 9:
77% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:20X
SYMM
1
45
8
METAL
TYP
SYMM 9
MECHANICAL DATA
DPR0010A
www.ti.com
SDC10A (Rev A)
www.ti.com
PACKAGE OUTLINE
C
.228-.244 TYP
[5.80-6.19]
.069 MAX
[1.75]
6X .050
[1.27]
8X .012-.020
[0.31-0.51]
2X
.150
[3.81]
.005-.010 TYP
[0.13-0.25]
0 - 8 .004-.010
[0.11-0.25]
.010
[0.25]
.016-.050
[0.41-1.27]
4X (0 -15 )
A
.189-.197
[4.81-5.00]
NOTE 3
B .150-.157
[3.81-3.98]
NOTE 4
4X (0 -15 )
(.041)
[1.04]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES:
1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.
Dimensioning and tolerancing per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed .006 [0.15] per side.
4. This dimension does not include interlead flash.
5. Reference JEDEC registration MS-012, variation AA.
18
.010 [0.25] C A B
5
4
PIN 1 ID AREA
SEATING PLANE
.004 [0.1] C
SEE DETAIL A
DETAIL A
TYPICAL
SCALE 2.800
www.ti.com
EXAMPLE BOARD LAYOUT
.0028 MAX
[0.07]
ALL AROUND
.0028 MIN
[0.07]
ALL AROUND
(.213)
[5.4]
6X (.050 )
[1.27]
8X (.061 )
[1.55]
8X (.024)
[0.6]
(R.002 ) TYP
[0.05]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
METAL SOLDER MASK
OPENING
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
EXPOSED
METAL
OPENING
SOLDER MASK METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED
METAL
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:8X
SYMM
1
45
8
SEE
DETAILS
SYMM
www.ti.com
EXAMPLE STENCIL DESIGN
8X (.061 )
[1.55]
8X (.024)
[0.6]
6X (.050 )
[1.27] (.213)
[5.4]
(R.002 ) TYP
[0.05]
SOIC - 1.75 mm max heightD0008A
SMALL OUTLINE INTEGRATED CIRCUIT
4214825/C 02/2019
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
SOLDER PASTE EXAMPLE
BASED ON .005 INCH [0.125 MM] THICK STENCIL
SCALE:8X
SYMM
SYMM
1
45
8
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