1. General description
The HEF4027B is a edge-trigg ered dua l JK flip-flop which fe atures indepen dent set-direct
(SD), clear-direct (CD), clock (CP) input s and outputs (Q, Q). Dat a is accepted when CP is
LOW, and transfer re d to the ou tp u t on th e po sitiv e- go in g ed ge of th e cl oc k. Th e active
HIGH asynchronous clear-direct (CD) and set-direct (SD) inputs ar e independent and
override the J, K, and CP inputs. The outputs are buffered for best system performance.
Schmitt trigger action makes the clock input highly tolerant of slower rise and fall times.
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another inpu t. It is
also suitable for use over the full industrial (40 °C to +85 °C) temperature range.
2. Features
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
Operates across the full industrial temperature range 40 °C to +85 °C
Complies with JEDEC standard JESD 13-B
3. Applications
Registers
Counters
Control circuits
4. Ordering information
HEF4027B
Dual JK flip-flop
Rev. 07 — 25 November 2009 Product data sheet
Table 1. Ordering information
Tamb from
40
°
C to +85
°
C.
Type number Package
Name Description Version
HEF4027BP DIP16 plastic dual in-line package; 16 leads (300 mil) SOT38-4
HEF4027BT SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 2 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
5. Functional diagram
Fig 1. Functional di agram
001aae593
9
10
13
11
12
7
6
3
1
2
15
14
5
4
1SD
1CD
1J 1Q
1CP
1K 1Q
2SD
2CD
2J 2Q
FF 2
FF 1
2CP
2K 2Q
Fig 2. Logic diagram of one flip-flop
001aae59
5
J
K
C
Q
CD
SD
CP
C
C
C
C
C
C
C
C
C
Q
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 3 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
6. Pinning information
6.1 Pinning
6.2 Pin description
7. Functional description
Fig 3. Pin configuratio n
HEF4027B
2Q V
DD
2Q 1Q
2CP 1Q
2CD 1CP
2K 1CD
2J 1K
2SD 1J
V
SS
1SD
001aae594
1
2
3
4
5
6
7
8
10
9
12
11
14
13
16
15
Table 2. Pin description
Symbol Pin Description
VSS 8 ground supply voltage
1SD, 2SD 9, 7 asynchronous set-direct input (active HIGH)
1J, 2J 10, 6 synchronous input
1K, 2K 11, 5 synchronous input
1CD, 2CD 12, 4 asynchronous clear-direct input (active HIGH)
1CP, 2CP 13, 3 clock input (LOW-to-HIGH edge-trigg ered)
1Q, 2Q 14, 2 complement output
1Q, 2Q 15, 1 true output
VDD 16 supply voltage
Table 3. Function table[1]
Inputs Outputs
nSD nCD nCP nJ nK nQ nQ
HLXXXHL
LHXXXLH
HHXXXHH
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 4 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care.; = positive-going transition.
8. Limiting values
[1] For DIP16 package: Ptot derates linearly with 12 mW/K above 70 °C.
[2] For SO16 package: Ptot derates linearly with 8 mW/K above 70 °C.
9. Recommended operating conditions
LLL L no change no change
LLHLHL
LLLHLH
LLHHnQ
nQ
Table 3. Function table[1] …continued
Inputs Outputs
nSD nCD nCP nJ nK nQ nQ
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 0.5 +18 V
IIK input clamping current VI<0.5 V or VI>V
DD + 0.5 V - ±10 mA
VIinput voltage 0.5 VDD + 0.5 V
IOK output clamping current VO<0.5 V or VO>V
DD + 0.5 V - ±10 mA
II/O input/output current - ±10 mA
IDD supply current - 50 mA
Tstg storage temperature 65 +150 °C
Tamb ambient temperature in free air 40 +85 °C
Ptot total power dissipation Tamb 40 °C to +85 °C
DIP16 package [1] -750mW
SO16 package [2] -500mW
P power dissipation per output - 100 mW
Table 5. Recommended operating con ditions
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 3 15 V
VIinput voltage 0 VDD V
Tamb ambient temperature in free air 40 +85 °C
Δt/ΔV input transition rise and fall rate VDD = 5 V - 3.7 5 μs/V
VDD = 10 V - 0.5 μs/V
VDD = 15 V - 0.08 μs/V
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 5 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
10. Static characteristics
Table 6. Static characteristics
VSS = 0 V; VI = VSS or VDD; unless otherwise specified.
Symbol Parameter Conditions VDD Tamb = 40 °C Tamb = 25 °C Tamb = 85 °CUnit
Min Max Min Max Min Max
VIH HIGH-level input voltage |IO| < 1 μA 5 V 3.5 - 3.5 - 3.5 - V
10 V 7.0 - 7.0 - 7.0 - V
15 V 11.0 - 11.0 - 11.0 - V
VIL LOW-level input voltage |IO| < 1 μA5 V-1.5-1.5-1.5V
10 V - 3.0 - 3.0 - 3.0 V
15 V - 4.0 - 4.0 - 4.0 V
VOH HIGH-level output voltage |IO| < 1 μA 5 V 4.95 - 4.95 - 4.95 - V
10 V 9.95 - 9.95 - 9.95 - V
15 V 14.95 - 14.95 - 14.95 - V
VOL LOW-level output voltage |IO| < 1 μA 5 V - 0.05 - 0.05 - 0.05 V
10 V - 0.05 - 0.05 - 0.05 V
15 V - 0.05 - 0.05 - 0.05 V
IOH HIGH-level output current VO = 2.5 V 5 V 1.7 - 1.4 - 1.1 - mA
VO = 4.6 V 5 V 0.52 - 0.44 - 0.36 - mA
VO = 9.5 V 10 V 1.3 - 1.1 - 0.9 - mA
VO = 13.5 V 15 V 3.6 - 3.0 - 2.4 - mA
IOL LOW-level output current VO = 0.4 V 5 V 0.52 - 0.44 - 0.36 - mA
VO = 0.5 V 10 V 1.3 - 1.1 - 0.9 - mA
VO = 1.5 V 15 V 3.6 - 3.0 - 2.4 - mA
IIinput leakage current 15 V - ±0.3 - ±0.3 - ±1.0 μA
IDD supply current IO = 0 A 5 V - 4.0 - 4.0 - 30 μA
10 V - 8.0 - 8.0 - 60 μA
15 V - 16.0 - 16.0 - 120 μA
CIinput capacitance - - - - 7.5 - - pF
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 6 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
11. Dynamic characteristics
Table 7. Dynamic characteristics
VSS = 0 V; Tamb = 25
°
C; for test circuit see Figure 7; unless otherwise speci fied.
Symbol Parameter Conditions VDD Extrapolation formula[1] Min Typ Max Unit
tPHL HIGH to LOW
propagation delay CP Q, Q;
see Figure 4 5 V 78 ns + (0.55 ns/pF)CL- 105 210 ns
10 V 29 ns + (0.23 ns/pF)CL-4080ns
15 V 22 ns + (0.16 ns/pF)CL-3060ns
CD Q;
see Figure 4 5 V 93 ns + (0.55 ns/pF)CL- 120 240 ns
10 V 33 ns + (0.23 ns/pF)CL-4590ns
15 V 27 ns + (0.16 ns/pF)CL-3570ns
SD Q;
see Figure 4 5 V 113 ns + (0.55 ns/pF ) C L- 140 280 ns
10 V 44 ns + (0.23 ns/pF)CL-55110ns
15 V 32 ns + (0.16 ns/pF)CL-4080ns
tPLH LOW to HIGH
propagation delay CP Q, Q;
see Figure 4 5 V 58 ns + (0.55 ns/pF)CL- 85 170 ns
10 V 27 ns + (0.23 ns/pF)CL-3570ns
15 V 22 ns + (0.16 ns/pF)CL-3060ns
CD Q;
see Figure 4 5 V 48 ns + (0.55 ns/pF)CL- 75 150 ns
10 V 24 ns + (0.23 ns/pF)CL-3570ns
15 V 17 ns + (0.16 ns/pF)CL-2550ns
SD Q;
see Figure 4 5 V 43 ns + (0.55 ns/pF)CL- 70 140 ns
10 V 19 ns + (0.23 ns/pF)CL-3060ns
15 V 17 ns + (0.16 ns/pF)CL-2550ns
tttransition time see Figure 4 5 V [2] 10 ns + (1.00 ns/pF)CL- 60 120 ns
10 V 9 ns + (0.42 ns/pF)CL-3060ns
15 V 6 ns + (0.28 ns/pF)CL-2040ns
tsu set-up time J, K CP;
see Figure 5 5 V 50 25 - ns
10 V 30 1 0 - ns
15 V 20 5 - ns
thhold time J, K CP;
see Figure 5 5 V 25 0 - ns
10 V 20 0 - ns
15 V 15 5 - ns
tWpulse width CP LOW;
minimum width
see Figure 5
5 V 80 40 - ns
10 V 30 1 5 - ns
15 V 24 1 2 - ns
SD, CD HIGH;
minimum width
see Figure 6
5 V 90 45 - ns
10 V 40 2 0 - ns
15 V 30 1 5 - ns
trec recovery time SD, CD inputs;
see Figure 6 5 V +20 15 - ns
10 V +15 10 - ns
15 V +10 5- ns
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 7 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
[2] tt is the same as tTLH and tTHL.
12. Waveforms
fmax maximum
frequency CP input;
J = K = HIGH;
see Figure 5
5 V 4 8 - MHz
10 V 12 25 - MHz
15 V 15 30 - MHz
Table 7. Dynamic characteristics …continued
VSS = 0 V; Tamb = 25
°
C; for test circuit see Figure 7; unless otherwise speci fied.
Symbol Parameter Conditions VDD Extrapolation formula[1] Min Typ Max Unit
Table 8. Dynamic power dissipation PD
PD can be calculated from the formulas shown. VSS = 0 V; tr = tf
20 ns; Tamb = 25
°
C.
Symbol Parameter VDD Typical formula for PD (μW) Where:
PDdynamic power
dissipation 5 V PD = 900 × fi + Σ(fo × CL) × VDD2fi = input frequency in MHz;
fo = output frequency in MHz;
CL = output load capacitance in pF;
VDD = supply voltage in V;
Σ(fo × CL) = sum of the outputs.
10 V PD = 4500 × fi + Σ(fo × CL) × VDD2
15 V PD = 13200 × fi + Σ(fo × CL) × VDD2
VOH and VOL are typical output voltages levels that occur with the output load.
Measurement points are given in Table 9.
Fig 4. Waveforms showing rise, fall and transition times an d propagation delays
Measurement points are given in Table 9.
Fig 5. Waveforms showing set-up and hold times and minimum clock pulse width
001aah86
3
SD, CD or CP
INPUT
V
I
0 V
V
OH
V
OL
Q or Q
OUTPUT V
M
V
M
t
PLH
t
PHL
90 %
90 %
10 %
10 %
t
r
t
TLH
t
THL
t
f
001aae59
6
CP INPUT
J,K INPUT
tW
VM
VM
1/fmax
tsu
th
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 8 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
VOH and VOL are typical output voltages levels that occur with the output load.
Measurement points are given in Table 9.
Fig 6. Waveforms showing pulse widths and recovery times
001aae59
7
SD
INPUT
V
I
0 V
V
I
0 V
V
I
0 V
V
OH
V
OL
CD INPUT
CP INPUT
t
W
t
W
V
M
V
M
V
M
Q OUTPUT
t
rec
t
rec
Table 9. Measurement points
Supply voltage Input Output
VDD VMVM
5 V to 15 V 0.5VDD 0.5VDD
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL= load capacitance including jig and probe capacitance.
RT= termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig 7. Tes t circui t
VDD
VIVO
001aag18
2
DUT
CL
RT
G
Table 10. Test data
Supply voltage Input Load
VDD VItr, tfCL
5 V to 15 V VSS or VDD 20 ns 50 pF
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 9 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
13. Package outline
Fig 8. Package outline SOT38-4 (DIP16)
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
SOT38-4 95-01-14
03-02-13
MH
c
(e )
1
ME
A
L
seating plane
A1
wM
b1
b2
e
D
A2
Z
16
1
9
8
E
pin 1 index
b
0 5 10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
UNIT A
max. 12 b1(1) (1) (1)
b2cD E e M Z
H
L
mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
A
min. A
max. bmax.
w
ME
e1
1.73
1.30
0.53
0.38
0.36
0.23
19.50
18.55
6.48
6.20
3.60
3.05 0.2542.54 7.62 8.25
7.80
10.0
8.3 0.764.2 0.51 3.2
inches 0.068
0.051
0.021
0.015
0.014
0.009
1.25
0.85
0.049
0.033
0.77
0.73
0.26
0.24
0.14
0.12 0.010.1 0.3 0.32
0.31
0.39
0.33 0.030.17 0.02 0.13
D
IP16: plastic dual in-line package; 16 leads (300 mil) SOT38
-4
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 10 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
Fig 9. Package outline SOT109-1 (SO16)
X
wM
θ
A
A1
A2
bp
D
HE
Lp
Q
detail X
E
Z
e
c
L
vMA
(A )
3
A
8
9
1
16
y
pin 1 index
UNIT A
max. A1A2A3bpcD
(1) E(1) (1)
eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75 0.25
0.10
1.45
1.25 0.25 0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8 1.27 6.2
5.8
0.7
0.6
0.7
0.3 8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT109-1 99-12-27
03-02-19
076E07 MS-012
0.069 0.010
0.004
0.057
0.049 0.01 0.019
0.014
0.0100
0.0075
0.39
0.38
0.16
0.15 0.05
1.05
0.041
0.244
0.228
0.028
0.020
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
0 2.5 5 mm
scale
S
O16: plastic small outline package; 16 leads; body width 3.9 mm SOT109
-1
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 11 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
14. Revision history
Table 11. Revision history
Document ID Release date Data sheet status Change notice Supersedes
HEF4027B_7 20091125 Product data sheet - HEF4027B_6
Modifications: Section 9 “Recommended operating conditions, Δt/ΔV values updated.
HEF4027B_6 20090624 Product data sheet - HEF4027B_5
HEF4027B_5 20081110 Product data sheet - HEF4027B_4
HEF4027B_4 20080703 Product specification - HEF4027B_CNV_3
HEF4027B_CNV_3 19950101 Product specification - HEF4027B_CNV_2
HEF4027B_CNV_2 19950101 Produ ct specification - -
HEF4027B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 25 November 2009 12 of 13
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
15. Legal information
15.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is document m ay have cha nged since thi s document w as publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warrant ies as to t he accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short dat a sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall pre va il.
15.3 Disclaimers
General — In formation in this document is believed to be accurate and
reliable. However, NXP Semiconductors d oes not give an y represent ations or
warranties, expressed or impli ed, as to the accuracy or completeness of such
information and shall have no liability for th e co nsequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use — NXP Semiconductors products are no t designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for il lustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ra tings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other co nditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may af fect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between inf ormation in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Not hing in this document may be interpret ed or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulatio ns. Export might require a prior
authorization from national authorities.
15.4 Trademarks
Notice: All refe renced brands, produc t names, service names and trademarks
are the property of their respective ow ners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contain s data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
NXP Semiconductors HEF4027B
Dual JK flip-f lo p
© NXP B.V. 2009. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of rele ase: 25 November 2009
Document identifier: HEF4027B_7
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
17. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
4 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
5 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
6 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
7 Functional description . . . . . . . . . . . . . . . . . . . 3
8 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
9 Recommended operating conditions. . . . . . . . 4
10 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5
11 Dynamic characteristics . . . . . . . . . . . . . . . . . . 6
12 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
14 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 11
15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 12
15.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12
15.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
15.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 12
15.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12
16 Contact information. . . . . . . . . . . . . . . . . . . . . 12
17 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13