BPW 34 B
Semiconductor Group 3 1997-11-19
Spektrale Fotoempfindlichkeit, λ = 400 nm
Spectral sensitivity Sλ0.2 A/W
Quantenausbeute, λ = 400 nm
Quantum yield η0.62 Electrons
Photon
Leerlaufspannung, Ev = 1000 Ix
Open-circuit voltage VO390 mV
Kurzschlußstrom
Short-circuit current
Ee = 0.5 mW/cm2,λ = 400 nm
ISC 7.4 (≥ 5.4) µA
Anstiegs- und Abfallzeit des Fotostromes
Rise and fall time of the photocurrent
RL = 50 Ω; VR= 5 V; λ = 850 nm; Ip = 800 µA
tr,tf25 ns
Durchlaßspannung, IF= 100 mA, E = 0
Forward voltage VF1.3 V
Kapazität, VR= 0 V, f= 1 MHz, E = 0
Capacitance C072 pF
Temperaturkoeffizient von VO
Temperature coefficient of VO
TCV– 2.6 mV/K
Temperaturkoeffizient von ISC
Temperature coefficient of ISC
TCI0.18 %/K
Rauschäquivalente Strahlungsleistung
Noise equivalent power
VR= 10 V, λ = 400 nm
NEP 1.3 ×10– 13 W
√Hz
Nachweisgrenze, VR= 10 V, λ = 400 nm
Detection limit D* 2.1 ×1012 cm · √Hz
W
Kennwerte (TA = 25 °C, Normlicht A, T = 2856 K)
Characteristics (TA = 25 °C, standard light A, T = 2856 K) (cont’d)
Bezeichnung
Description Symbol
Symbol Wert
Value Einheit
Unit