To all our customers Regarding the change of names mentioned in the document, such as Hitachi Electric and Hitachi XX, to Renesas Technology Corp. The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog and discrete devices, and memory chips other than DRAMs (flash memory, SRAMs etc.) Accordingly, although Hitachi, Hitachi, Ltd., Hitachi Semiconductors, and other Hitachi brand names are mentioned in the document, these names have in fact all been changed to Renesas Technology Corp. Thank you for your understanding. Except for our corporate trademark, logo and corporate statement, no changes whatsoever have been made to the contents of the document, and these changes do not constitute any alteration to the contents of the document itself. Renesas Technology Home Page: http://www.renesas.com Renesas Technology Corp. Customer Support Dept. April 1, 2003 Cautions Keep safety first in your circuit designs! 1. Renesas Technology Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corporation product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corporation or a third party. 2. Renesas Technology Corporation assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corporation without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Renesas Technology Corporation assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Renesas Technology Corporation by various means, including the Renesas Technology Corporation Semiconductor home page (http://www.renesas.com). 4. When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. Renesas Technology Corporation assumes no responsibility for any damage, liability or other loss resulting from the information contained herein. 5. Renesas Technology Corporation semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contact Renesas Technology Corporation or an authorized Renesas Technology Corporation product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corporation is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corporation for further details on these materials or the products contained therein. 4AK17 Silicon N-Channel Power MOS FET Array ADE-208-1202 (Z) 1st. Edition Mar. 2001 Application High speed power switching Features * Low on-resistance R DS(on) 0.045 , VGS = 10 V, I D = 10 A R DS(on) 0.065 , VGS = 4 V, I D = 10 A * Capable of 4 V gate drive * Low drive current * High speed switching * High density mounting * Suitable for motor driver, solenoid driver and lamp driver 4AK17 Outline SP-10 3 D 5 D 4 G 7 D 12 34 56 78 9 10 9 D 6 G 8 G 2G 1S S 10 1, 10. Source 2, 4, 6, 8. Gate 3, 5, 7, 9. Drain Absolute Maximum Ratings (Ta = 25C) (1 Unit) Item Symbol Rating Unit Drain to source voltage VDSS 60 V Gate to source voltage VGSS 20 V Drain current ID 10 A 40 A 10 A 28 W Drain peak current I D(pulse)* Body to drain diode reverse drain current I DR Channel dissipation 1 Pch (Tc = 25C)* 2 2 Channel dissipation Pch* 4 W Channel temperature Tch 150 C Storage temperature Tstg -55 to +150 C Notes: 1. PW 10 s, duty cycle 1% 2. 4 devices operation 2 4AK17 Electrical Characteristics (Ta = 25C) (1 Unit) Item Symbol Min Typ Max Unit Test conditions Drain to source breakdown voltage V(BR)DSS 60 -- -- V I D = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS 20 -- -- V I G = 100 A, VDS = 0 Gate to source leak current I GSS -- -- 10 A VGS = 16 V, VDS = 0 Zero gate voltage drain current I DSS -- -- 250 A VDS = 50 V, VGS = 0 Gate to source cutoff voltage VGS(off) 1.0 -- 2.0 V I D = 1 mA, VDS = 10 V Static drain to source on state resistance RDS(on) -- 0.033 0.045 I D = 10 A VGS = 10 V*1 -- 0.04 0.065 I D = 10 A VGS = 4 V*1 Forward transfer admittance |yfs| 10 17 -- S I D = 10 A VDS = 10 V*1 Input capacitance Ciss -- 1400 -- pF VDS = 10 V Output capacitance Coss -- 720 -- pF VGS = 0 Reverse transfer capacitance Crss -- 220 -- pF f = 1 MHz Turn-on delay time t d(on) -- 15 -- ns I D = 10 A Rise time tr -- 95 -- ns VGS = 10 V Turn-off delay time t d(off) -- 300 -- ns RL = 3 Fall time tf -- 170 -- ns Body to drain diode forward voltage VDF -- 1.05 -- V I F = 10 A, VGS = 0 Body to drain diode reverse recovery time t rr -- 110 -- ns I F = 10 A, VGS = 0 dIF/dt = 50 A/s Note: 1. Pulse test 3 4AK17 Maximum Channel Dissipation Curve Maximum Channel Dissipation Curve Condition : Channel Dissipation of each die is identical 5 4 Device Operation 3 Device Operation 2 Device Operation 4 1 Device Operation 3 2 1 25 75 50 100 125 Ambient Temperature Ta (C) 0 30 Channel Dissipation Pch (W) Channel Dissipation Pch (W) 6 50 100 40 s m s pe O (1 ot ) tio ra n 1.0 sh Drain Current ID (A) ea ar (o n) s DS 0 O is per lim at ite ion d in by th R is 10 m 10 C 3 = 1 10 D (T C Drain Current ID (A) 10 s PW 10 4.5 V 4.0 V Pulse Test 3.0 V 10 VGS = 2.5 V ) 4 8V 6V 20 C 0.1 0.1 150 3.5 V 25 Ta = 25C 10 V 30 = 0.3 25 75 50 100 125 Case Temperature TC (C) Typical Output Characteristics Maximum Safe Operation Area 30 20 0 150 Condition : Channel Dissipation of each die is identical 4 Device Operation 3 Device Operation 2 Device Operation 1 Device Operation 0 0.3 1.0 3 10 30 100 Drain to Source Voltage VDS (V) 6 2 4 8 10 Drain to Source Voltage VDS (V) 4AK17 Drain to Source Saturation Voltage vs. Gate to Source Voltage Typical Transfer Characteristics 50 Drain to Source Saturation Voltage VDS (on) (V) VDS = 10 V Pulse Test TC= 25C -25C 30 20 10 3 1 2 4 Gate to Source Voltage VGS (V) Static Drain to Source on Static Resistance RDS (on) () 0 5 3 1 Pulse Test 0.2 VGS = 4 V 0.1 10 V 0.02 0.01 0.005 2 10 50 5 20 Drain Current ID (A) 20 A 10 A 6 2 4 8 10 Gate to Source Voltage VGS (V) Static Drain to Source on State Resistance vs. Temperature 0.5 1 ID = 50 A 2 Static Drain to Source on State Resistance vs. Drain Current 0.05 Pulse Test 4 0 100 Static Drain to Source on State Resistance RDS (on) () Drain Current ID (A) 40 5 75C 0.10 Pulse Test ID = 20 A 0.08 0.06 10 A VGS = 4 V 20 A 5 A 10 A 0.04 5A 0.02 0 -40 VGS = 10 V 80 0 40 120 Case Temperature TC (C) 160 5 4AK17 Body to Diode Reverse Recovery Time 1,000 100 50 -25C TC = 25C 20 10 75C 5 2 1 0.5 1.0 2 10 20 5 Drain Current ID (A) 500 200 100 50 20 10 0.5 50 Typical Capacitance vs. Drain to Source Voltage 2 1.0 5 10 20 Reverse Drain Current IDR (A) VGS = 0 f = 1 MHz Ciss 1,000 Coss 300 Crss 100 30 Drain to Source Voltage VDS (V) 100 3,000 20 VDD = 50 V 25 V 80 16 10 V 60 VGS VDS 40 20 6 10 20 30 40 50 Drain to Source Voltage VDS (V) 0 12 8 VDD = 50 V 25 V 10 V 4 ID = 25 A 10 0 50 Dynamic Input Characteristics 10,000 Capacitance C (pF) di/dt = 50 A/s, Ta = 25C VGS = 0 Pulse Test 20 40 60 80 Gate Charge Qg (nc) 0 100 Gate to Source Voltage VGS (V) VDS = 10 V Pulse Test Reverse Recovery Time trr (ns) Forward Transfer Admittance yfs (S) Forward Transfer Admittance vs. Drain Current 4AK17 Reverse Drain Current vs. Source to Drain Voltage Switching Characteristics 50 500 td (off) 200 tf 100 tr 50 VGS = 10 V VDD = 30 V PW = 2s, duty < 1 % * * 20 10 0.5 td (on) Reverse Drain Current IDR (A) Switching Time t (ns) 1000 40 30 5 2 10 20 Drain Current ID (A) 50 10 V 15 V 20 5V 10 0 1.0 Pulse Test VGS = 0, -5 V 0.4 1.2 0.8 2.0 1.6 Source to Drain Voltage VSD (V) 7 4AK17 Package Dimensions As of January, 2001 Unit: mm 26.5 0.3 1.82 2.54 1 2 3 4 0.55 0.1 1.4 5 6 7 10.5 0.5 2.5 10.0 0.3 4.0 0.2 8 9 1.5 0.2 +0.1 0.55 -0.06 10 Hitachi Code JEDEC EIAJ Mass (reference value) 8 SP-10 -- -- 2.9 g 4AK17 Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products. Hitachi, Ltd. Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109 URL NorthAmerica Europe Asia Japan : : : : http://semiconductor.hitachi.com/ http://www.hitachi-eu.com/hel/ecg http://sicapac.hitachi-asia.com http://www.hitachi.co.jp/Sicd/indx.htm For further information write to: Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe GmbH Electronic Components Group Dornacher Strae 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Asia Ltd. Hitachi Tower 16 Collyer Quay #20-00, Singapore 049318 Tel : <65>-538-6533/538-8577 Fax : <65>-538-6933/538-3877 URL : http://www.hitachi.com.sg Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 585160 Hitachi Asia Ltd. (Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road, Hung-Kuo Building, Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon, Hong Kong Tel : <852>-(2)-735-9218 Fax : <852>-(2)-730-0281 URL : http://www.hitachi.com.hk Copyright Hitachi, Ltd., 2000. All rights reserved. Printed in Japan. Colophon 2.0 9