SILICON SMALL SIGNAL
N-CHANNEL JFET
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Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing orders.
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com
Document Number 8518
Issue 2
Page 1 of 4
2N4393C1
• Hermetic Surface Mounted Package.
• Designed For High Reliability and Space Applications.
•
Screening Options Available.
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise stated)
VDS Drain – Source Voltage 40V
VGS Gate – Source Voltage -40V
VGD Gate – Drain Voltage -40V
IG Gate Current 50mA
PD Total Power Dissipation at TA = 25°C 300mW
Derate Above 25°C 2mW/°C
TJ Junction Temperature Range -55 to +175°C
Tstg Storage Temperature Range -65 to +200°C
THERMAL PROPERTIES
Symbols Parameters Min. Typ. Max. Units
RθJA Thermal Resistance, Junction To Ambient 500 °C/W
SILICON SMALL SIGNAL
N-CHANNEL JFET
2N4393C1
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com
Document Number 8518
Issue 2
Page 2 of 4
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
Symbols Parameters Test Conditions Min.
Typ Max.
Units
V(BR)GSS Gate – Source
Breakdown Voltage VDS = 0V IG = 1.0µA -40
VGS(off) Gate – Source
Cut-off Voltage VDS = 20V ID = 1.0nA -0.5 -3
V
IDSS
(1)
Saturation
Drain Current VDS = 20V VGS = 0V 5 30 mA
VDS = 0V VGS = -20V -100 pA
IGSS Gate Reverse Current
TA = 150°C -200 nA
VDS = 20V VGS = -5V 100 pA
ID(off) Drain Cut-off Current
TA = 150°C 200 nA
VDS(on) Drain – Source
On Voltage VGS = 0V ID = 3mA 0.4 V
RDS(on) Drain – Source
On Resistance VGS = 0 ID = 1.0mA 100 Ω
DYNAMIC CHARACTERISTICS
Ciss Common – Source
Input Capacitance
VDS = 20V
f = 1.0MHz
VGS = 0V
26
Crss Common – Source Reverse
Transfer Capacitance
VDS = 0V
f = 1.0MHz
VGS = -5V
5
pF
RDS(on) Drain – Source
On Resistance
VGS = 0
f = 1.0KHz ID = 0A 100 Ω
ēn
(2)
Equivalent Input Noise
Voltage
VDG = 10V
f = 1.0KHz ID = 1.0mA 3 nV
√Hz
tr Rise Time 5
td(on) Turn-on Delay Time 15
tf Fall Time 30
td(off) Turn-off Delay Time
VDD = 10V
VGS = 0V
VGSX = -5V
ID(on) = 3mA
50
ns
Notes
NotesNotes
Notes
(1) Pulse Width ≤ 300us, δ ≤ 2%
(2) By design only, not a production test.
SILICON SMALL SIGNAL
N-CHANNEL JFET
2N4393C1
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com
Document Number 8518
Issue 2
Page 3 of 4
MECHANICAL DATA
Dimensions in mm (inches)
C1
Underside View
PACKAGE VARIANT TABLE
Variant Pad 1 Pad 2 Pad 3 Pad 4
A Drain Source Gate No Pad (3-Pins Only)
B Drain Source Gate Lid Contact *
C Source Drain Gate No Pad (3-Pins Only)
D Source Drain Gate Lid Contact *
* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep
dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to
be specified at order.
2 1
0.51 ± 0.10
(0.02 ± 0.004)
1.91 ± 0.10
(0.075 ± 0.004)
3.05 ± 0.13
(0.12 ± 0.005)
2.54 ± 0.13
(0.10 ± 0.005)
0.76 ± 0.15
(0.03 ± 0.006)
1.40
(0.055)
max.
0.31
(0.012)rad.
3
1.02 ± 0.10
(0.04 ± 0.004)
4
R0.56
(0.022)
R0.31
(0.012)
See
Package
Variant
Table
SILICON SMALL SIGNAL
N-CHANNEL JFET
2N4393C1
Semelab Limited
Semelab LimitedSemelab Limited
Semelab Limited
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com
Document Number 8518
Issue 2
Page 4 of 4
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the High Reliability and
Screening Options Handbook available for download from
the from the TT electronics Semelab web site.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MIL-
PRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF-
19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
MARKING DETAILS
Screened parts are typically marked with specification
number, serial number (or week of seal) as shown in the
example below. All non screened parts are printed with
three characters only eg. 22A.
Customer specific marking requirements can be arranged at
time of order but is approximately limited to two lines of
7 Characters. This is to ensure text remains readable..
Example Marking:
ORDERING INFORMATION
Part number is built from part, package variant and
screening level. The part number can be extended to
include the additional options as shown below.
Type – See Electrical Stability Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Customer Pre-Cap Visual Inspection .CVP
Customer Buy-Off visit .CVB
Data Pack .DA
Solderability Samples .SS
Scanning Electron Microscopy .SEM
Radiography (X-ray) .XRAY
Total Dose Radiation Test .RAD
MIL-PRF-19500 (QR217)
Group B charge .GRPB
Group B destructive mechanical samples .GBDM (12 pieces)
Group C charge .GRPC
Group C destructive electrical samples .GCDE (12 pieces)
Group C destructive mechanical samples .GCDM (6 pieces)
ESA/ESCC
Lot Validation Testing (subgroup 1) charge .LVT1
LVT1 destructive samples (environmental) .L1DE (15 pieces)
LVT1 destructive samples (mechanical) .L1DM (15 pieces)
Lot Validation Testing (subgroup 2) charge .LVT2
LVT2 endurance samples (electrical) .L2D (15 pieces)
Lot Validation Testing (subgroup 3) charge .LVT3
LVT3 destructive samples (mechanical) .L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
Example ordering information:
The following example is for the 2N4393C1 part, package
variant D, JQRS screening, additional Group C conformance
testing and a Data pack.
Part Numbers:
2N4393C1D-JQRS
(Include quantity for flight parts)
2N4393C1D-JQRS.GRPC
(chargeable conformance option)
2N4393C1D-JQRS.GCDE
(charge for destructive parts)
2N4393C1D-JQRS.GCDM
(charge for destructive parts)
2N4393C1D-JQRS.DA
(charge for Data pack)
Customers with any specific requirements (e.g. marking,
package or screening) may be supplied with a similar
alternative part number (there is maximum 20 character
limit to part numbers). Contact Semelab sales with all
enquiries
High Reliability and Screening Options Handbook link:
http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
